参数资料
| 型号： | ADATE207BBPZ |
| 厂商： | Analog Devices Inc |
| 文件页数： | 15/36页 |
| 文件大小： | 0K |
| 描述： | IC TIMING FORMATTER QUAD 256BGA |
| 标准包装： | 1 |
| 类型： | 四针定时格式器 |
| PLL： | 是 |
| 主要目的： | 自动测试设备 |
| 电路数： | 4 |
| 频率 - 最大： | 100MHz |
| 电源电压： | 2.375 V ~ 2.625 V |
| 工作温度： | -25°C ~ 85°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 256-LBGA 裸露焊盘 |
| 供应商设备封装： | 256-BGA（27x27） |
| 包装： | 托盘 |
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ADATE207
Rev. 0 | Page 22 of 36
CHANNEL SPECIFIC AND COMMON REGISTERS
Detailed register descriptions divided into channel-specific and common registers.
Channel Specific Registers
Name:
Comparator and Fail Status
Address:
0x00
Type:
Read
Table 14. Comparator and Fail Status
Position
Description
Reset State
Bits[15:08]
Not used.
0x00
Bit 07
Edge Error: Edges Longer Than 4 T0 Cycles. This occurs when the edge delay counters are reloaded
before they complete counting down, thus, causing a missing edge.
0x0
Bit 06
Edge Error: Out of Order Edge Strobes. This occurs when one or more edge delay counters complete
counting out of order (wrong action code is paired with an edge), or two edge delay counters complete
counting at the same CLK400 edge (causing a missing edge).
0x0
Bit 05
Edge Error: Adder Overflow. This occurs when the residue or calibration constant adders overflow
causing edge delays to wrap around. This results in incorrect edge timing.
0x0
Bit 04
Edge Error: Two Edges Too Close. This occurs when either the drive or compare verniers receive
nonincreasing delay values in back-to-back CLK400 cycles. The verniers become unsynchronized
and cause incorrect edge timing thereafter.
0x0
Bits[03:00]
Accumulated Fail Registers. These four data bits provide up to four possible DUT failures—one for each
edge delay. The bits are decoded as follows:
0x0
Bit 00 = D0 edge or window failures.
Bit 01 = D1 edge failure or D0/D1 window failures.
Bit 02 = D2 edge or window failures.
Bit 03 = D3 edge failure or a D3/D2 window failure.
Name:
Fail Counter Low
Address:
0x01
Type:
Read/Write
Table 15. Fail Counter Low
Position
Description
Reset State
Bits[15:00]
Fail Counter Data Low Order Bits. This field contains the 16 LSBs of the fail counter. This register and the
fail counter data high register represent a binary encoded, 32-bit, number of fail events (up to 4 fail events
per T0 period) detected during the last pattern burst.
The CPU reads this register while the pattern is bursting, capturing a snapshot of the fail count at the time
of reading the low register. Writes during pattern burst can produce indeterminate results if fails are
occurring during the write cycle.
The CPU must read the contents of the counter by performing sequential reads from the fail counter low
register followed by a read from the fail counter high register. Reading from the fail counter low register
performs the transfer of data from the counter to a temporary holding register. Reading from the fail
counter high register reads solely from the temporary holding register.
For diagnostics, the CPU can preload the contents of the counter by performing sequential writes to the
Fail Counter CHx data low register followed by a write to the Fail Counter Chx data high register. Writing to
the Fail Counter Chx data high register performs the transfer of data from temporary holding registers to
the 32-bit counter.
0x0000
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