参数资料
型号: ADM1276-3ACPZ-RL
厂商: Analog Devices Inc
文件页数: 6/48页
文件大小: 0K
描述: IC HOT SWAP CTLR PMBUS 20LFCSP
标准包装: 5,000
类型: 热交换控制器
应用: 通用
内部开关:
电流限制: 可调
电源电压: 2.95 V ~ 20 V
工作温度: -40°C ~ 85°C
安装类型: 表面贴装
封装/外壳: 20-WQFN 裸露焊盘,CSP
供应商设备封装: 20-LFCSP-WQ(5x5)
包装: 带卷 (TR)
ADM1276
Data Sheet
Parameter
Symbol
Min
Typ
Max
Unit
Test Conditions/Comments
GPO2/ALERT2 PIN
Output Low Voltage
Leakage Current
V OL_GPO2
0.4
1.5
100
1
V
V
nA
μA
I GPO2 = 1 mA
I GPO2 = 5 mA
V GPO2 ≤ 2 V; GPO output high-Z
V GPO2 = 20 V; GPO output high-Z
PWRGD PIN
Output Low Voltage
VCC That Guarantees Valid
Output
Leakage Current
V OL_PWRGD
1
0.4
1.5
100
1
V
V
V
nA
μA
I PWRGD = 1 mA
I PWRGD = 5 mA
I SINK = 100 μA; V OL_PWRGD = 0.4 V
V PWRGD ≤ 2 V; PWRGD output high-Z
V PWRGD = 20 V; PWRGD output high-Z
CURRENT AND VOLTAGE
MONITORING
Current Sense Absolute
Error
25 mV input range; 128 sample averaging (unless otherwise
noted)
±0.2
±0.7
%
V SENSE = 20 mV; V SENSE+ = 12 V; T A = 0°C to 65°C
±0.08
±0.08
±0.2
±0.08
±0.2
±0.09
±0.2
±0.04
±0.15
±1.0
±1.0
±2.8
±0.7
±0.75
±0.8
±1.1
±2.0
±4.3
%
%
%
%
%
%
%
%
%
%
%
%
%
%
%
%
%
%
V SENSE = 20 mV; V SENSE+ = 12 V; T A = 25°C
V SENSE = 20 mV
V SENSE = 20 mV; T A = 25°C
V SENSE = 20 mV; T A = 0°C to 65°C
V SENSE = 20 mV; 16 sample averaging
V SENSE = 20 mV; 16 sample averaging; T A = 25°C
V SENSE = 20 mV; 16 sample averaging; T A = 0°C to 65°C
V SENSE = 20 mV; 1 sample averaging
V SENSE = 20 mV; 1 sample averaging; T A = 25°C
V SENSE = 20 mV; 1 sample averaging; T A = 0°C to 65°C
V SENSE = 25 mV; V SENSE+ = 12 V
V SENSE = 25 mV; V SENSE+ = 12 V; T A = 25°C
V SENSE = 25 mV; V SENSE+ = 12 V; T A = 0°C to 65°C
V SENSE = 20 mV; V SENSE+ = 12 V
V SENSE = 15 mV; V SENSE+ = 12 V
V SENSE = 10 mV; V SENSE+ = 12 V
V SENSE = 5 mV; V SENSE+ = 12 V
V SENSE = 2.5 mV; V SENSE+ = 12 V
SENSE+/VOUT Absolute
Error
ADC Conversion Time
237
360
3753
±1.0
±1.0
280
426
4233
%
%
μs
μs
μs
Low input range; input voltage ≥ 3 V
High input range; input voltage ≥ 10 V
Includes time for power multiplication
1 sample of VIN and IOUT; from command received to valid
data in register
1 sample of VIN, VOUT, and IOUT; from command received to
valid data in register
16 samples of VIN and IOUT averaged; from command
received to valid data in register
Power Multiplication Time
5545
14
6570
μs
μs
16 samples of VIN, VOUT, and IOUT averaged; from command
received to valid data in register
ADR PIN
Address Set to 00
Input Current for Address 00
0
?40
?22
0.8
V
μA
Connect to GND
V ADR = 0 V to 0.8 V
Address Set to 01
Address Set to 10
135
?1
150
165
+1
k?
μA
Resistor to GND
No connect state; maximum leakage current allowed
Rev. C | Page 6 of 48
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