参数资料
型号: EM250-RCM-R
厂商: Silicon Laboratories Inc
文件页数: 14/124页
文件大小: 0K
描述: EM250 RCM BOARD
标准包装: 12
类型: 收发器,802.15.4/Zigbee
频率: 2.4GHz
适用于相关产品: EM250
其它名称: 636-1023
EM250
Table 6 contains the digital I/O specifications for the EM250. The digital I/O power (named VDD_PADS) comes
from three dedicated pins (Pins 17, 23, and 28). The voltage applied to these pins sets the I/O voltage.
Table 6. Digital I/O Specifications
Parameter
Voltage supply
Input voltage for logic 0
Input voltage for logic 1
Name
VDD_PADS
V IL
V IH
Min.
2.1
0
0.8 x VDD_PADS
Typ.
Max.
3.6
0.2 x VDD_PADS
VDD_PADS
Unit
V
V
V
Input current for logic 0
Input current for logic 1
Input pull-up resistor value
Input pull-down resistor value
I IL
I IH
R IPU
R IPD
30
30
- 0.5
0.5
μ A
μ A
k ?
k ?
Output voltage for logic 0
Output voltage for logic 1
V OL
V OH
0
0.82 x VDD_PADS
0.18 x VDD_PADS
VDD_PADS
V
V
Output source current (standard current pad)
Output sink current (standard current pad)
Output source current
high current pad: GPIO[16:13]
Output sink current
high current pad: GPIO[16:13]
Total output current (for I/O Pads)
Input voltage threshold for OSC32A
Input voltage threshold for OSCA
Output voltage level (TX_ACTIVE)
Output source current (TX_ACTIVE)
3.5
RF Electrical Characteristics
3.5.1
Receive
I OHS
I OLS
I OHH
I OLH
I OH + I OL
0.2 x VDD_PADS
0.2 x VDD_CORE
0.18 x VDD_CORE
4
4
8
8
40
0.8 x VDD_PADS
0.8 x VDD_CORE
0.82 x VDD_CORE
1
mA
mA
mA
mA
mA
V
V
V
mA
Table 7 lists the key parameters of the integrated IEEE 802.15.4 receiver on the EM250.
120-0082-000V Rev 1.1
Note:
Note:
Receive Measurements were collected with Silicon Labs’ EM250 Lattice Balun Reference Design
(Version B1) at 2440MHz and using the EmberZNet software stack Version 3.0.1. The Typical number
indicates one standard deviation above the mean, measured at room temperature (25 ? C). The Min and
Max numbers were measured over process corners at room temperature.
The adjacent channel rejection (ACR) measurements were performed by using an unfiltered, ideal
IEEE 802.15.4 signal of continuous pseudo-random data as the interferer. For more information on ACR
measurement techniques, see document AN709, Adjacent Channel Rejection Measurements .
Page 14
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