参数资料
型号: IDT7026L20G
厂商: IDT, Integrated Device Technology Inc
文件页数: 4/18页
文件大小: 0K
描述: IC SRAM 256KBIT 20NS 84PGA
标准包装: 3
格式 - 存储器: RAM
存储器类型: SRAM - 双端口,异步
存储容量: 256K(16K x 16)
速度: 20ns
接口: 并联
电源电压: 4.5 V ~ 5.5 V
工作温度: 0°C ~ 70°C
封装/外壳: 84-BPGA
供应商设备封装: 84-PGA(27.94x27.94)
包装: 托盘
其它名称: 7026L20G
IDT7026S/L
High-Speed 16K x 16 Dual-Port Static RAM
Military, Industrial and Commercial Temperature Ranges
Truth Table I – Non-Contention Read/Write Control
Inputs (1)
Outputs
CE
H
X
L
L
L
L
L
L
X
R/ W
X
X
L
L
L
H
H
H
X
OE
X
X
X
X
X
L
L
L
H
UB
X
H
L
H
L
L
H
L
X
LB
X
H
H
L
L
H
L
L
X
SEM
H
H
H
H
H
H
H
H
X
I/O 8-15
High-Z
High-Z
DATA IN
High-Z
DATA IN
DATA OUT
High-Z
DATA OUT
High-Z
I/O 0-7
High-Z
High-Z
High-Z
DATA IN
DATA IN
High-Z
DATA OUT
DATA OUT
High-Z
Mode
Deselected: Power-Down
Both Bytes Deselected
Write to Upper Byte Only
Write to Lower Byte Only
Write to Both Bytes
Read Upper Byte Only
Read Lower Byte Only
Read Both Bytes
Outputs Disabled
2939 tbl 04
NOTE:
1. A 0L — A 13L ≠ A 0R — A 13R.
Truth Table II – Semaphore Read/Write Control (1)
Inputs
Outputs
CE
H
X
H
X
L
L
R/ W
H
H
X
X
OE
L
L
X
X
X
X
UB
X
H
X
H
L
X
LB
X
H
X
H
X
L
SEM
L
L
L
L
L
L
I/O 8-15
DATA OUT
DATA OUT
DATA IN
DATA IN
______
______
I/O 0-7
DATA OUT
DATA OUT
DATA IN
DATA IN
______
______
Mode
Read Data in Semaphore Flag
Read Data in Semaphore Flag
Write I/O 0 into Semaphore Flag
Write I/O 0 into Semaphore Flag
Not Allowed
Not Allowed
NOTE:
1. There are eight semaphore flags written to via I/O 0 and read from all I/O's (I/O 0 -I/O 15 ). These eight semaphores are addressed by A 0 - A 2 .
Absolute Maximum Ratings (1)
2939 tbl 05
Symbol
V TERM (2)
Rating
Terminal Voltage with Respect to GND
Commercial
& Industrial
-0.5 to +7.0
Military
-0.5 to +7.0
Unit
V
T BIAS
T STG
Temperature Under Bias
Storage Temperature
-55 to +125
-55 to +125
-65 to +135
-65 to +150
o
o
C
C
I OUT
DC Output Current
50
50
mA
NOTES:
2939 tbl 06
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure
to absolute maximum rating conditions for extended periods may affect reliability.
2. V TERM must not exceed Vcc + 10% for more than 25% of the cycle time or 10ns maximum, and is limited to < 20mA for the period of
V TERM > Vcc + 10%.
6.42
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