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参数资料
| 型号： | LXT386LE |
| 英文描述： | PCM TRANSCEIVER|QUAD|CEPT PCM-30/E-1|CMOS|QFP|100PIN|PLASTIC |
| 中文描述： | 的PCM收发器|四|优税PCM-30/E-1 |的CMOS | QFP封装| 100引脚|塑料 |
| 文件页数： | 54/80页 |
| 文件大小： | 1112K |
| 代理商： | LXT386LE |
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LXT384
—
Octal T1/E1/J1 Transceiver
54
Datasheet
5.0
Test Specifications
Note:
Table 35
through
Table 54
and
Figure 18
through
Figure 35
represent the performance
specifications of the LXT384 and are guaranteed by test except, where noted, by design. The
minimum and maximum values listed in
Table 37
through
Table 54
are guaranteed over the
recommended operating conditions specified in
Table 36
.
Table 34. Instruction Register (IR)
Instruction
Code #
Comments
EXTEST
000
Connects the BSR to TDI and TDO. Input pins values are loaded into the
BSR. Output pins values are loaded from the BSR.
INTEST_ANALOG
010
Connects the ASR to TDI and TDO. Allows voltage forcing/sensing through
AT1 and AT2. Refer to
Table 32
.
SAMPLE / PRELOAD
100
Connects the BSR to TDI and TDO. The normal path between the LXT384
logic and the I/O pins is maintained. The BSR is loaded with the signals in
the I/O pins.
IDCODE
110
Connects the IDR to the TDO pin.
BYPASS
111
Serial data from the TDI input is passed to the TDO output through the 1 bit
Bypass Register.
Table 35. Absolute Maximum Ratings
Parameter
Symbol
Min.
Max
Unit
DC supply voltage
Vcc0, Vcc1,
Vccio0, Vccio1
-0.5
4.0
V
DC supply voltage
Tvcc 0-7
-0.5
7.0
V
Input voltage on any digital pin
Vin
GND-0.5
5.5
V
Input voltage on RTIP, RRING
1
Vin
GND-0.5
V
CC
0 + 0.5
V
CC
1 + 0.5
V
ESD voltage on any Pin
2
Vin
2000
–
V
Transient latch-up current on any pin
Iin
100
mA
Input current on any digital pin
3
Iin
-10
10
mA
DC input current on TTIP, TRING
3
Iin
–
±100
mA
DC input current on RTIP, RRING
3
Iin
–
±100
mA
Storage temperature
Tstor
-65
+150
°
C
Maximum power dissipation in package
P
P
1.6
W
Case Temperature, 144 pin LQFP package
T
case
120
°
C
Case Temperature, 160 pin PBGA package
T
case
120
°
C
Caution:
Exceeding these values may cause permanent damage. Functional operation under these
conditions is not implied. Exposure to absolute maximum rating conditions for extended periods may
affect device reliability.
1. Referenced to ground.
2. Human body model.
3. Constant input current.
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