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参数资料
| 型号： | MPC9893FAR2 |
| 厂商： | INTEGRATED DEVICE TECHNOLOGY INC |
| 元件分类： | 时钟及定时 |
| 英文描述： | 9893 SERIES, PLL BASED CLOCK DRIVER, 12 TRUE OUTPUT(S), 0 INVERTED OUTPUT(S), PQFP48 |
| 封装： | 7 X 7 MM, LQFP-48 |
| 文件页数： | 11/16页 |
| 文件大小： | 285K |
| 代理商： | MPC9893FAR2 |
MPC9893
MOTOROLA
TIMING SOLUTIONS
4
Table 3: CLOCK FREQUENCY CONFIGURATION
Name
FSEL0
FSEL1
FSEL2
FSEL3
fREF range
QAx
QBx
QFB
FBa
Name
FSEL0
FSEL1
FSEL2
FSEL3
fREF range
[MHz]
Ratio
fQAX [MHz]
Ratio
fQBX[MHz]
QFB
FBa
M8
0
15 25
f
*8
120 200
fREF *8
120—200
f
16
M82
0
1
15—25
fREF *8
120—200
fREF *4
60—100
fREF
16
M4
0
1
0
30 50
f
* 4
120 200
fREF *4
120—200
f
8
M42
0
1
30—50
fREF * 4
120—200
fREF *2
60—100
fREF
8
M3
0
1
0
40 66 6
f
* 3
120 200
fREF *3
120—200
f
6
M32
0
1
0
1
40—66.6
fREF * 3
120—200
fREF *3 ÷ 2
60—100
fREF
6
M2M
0
1
0
30 50
f
* 2
60 100
fREF *2
60—100
f
8
M22M
0
1
30—50
fREF * 2
60—100
fREF
30—50
fREF
8
M2H
1
0
60 100
f
* 2
120 200
fREF *2
120—200
f
4
M22H
1
0
1
60—100
fREF * 2
120—200
fREF
60—100
fREF
4
M1L
1
0
1
0
15 25
f
15 25
fREF
15—25
f
16
M12L
1
0
1
15—25
fREF
15—25
fREF ÷ 2
7.5—12.5
fREF
16
M1M
1
0
30 50
f
30 50
fREF
30—50
f
8
M12M
1
0
1
30—50
fREF
30—50
fREF ÷ 2
15—25
fREF
8
M1H
1
0
60 100
f
60 100 0
fREF
60—100
f
4
M12H
1
60—100
fREF
60—100.0
fREF ÷ 2
30—50
fREF
4
a. FB: Internal PLL feedback divider
Table 4: GENERAL SPECIFICATIONS
Symbol
Characteristics
Min
Typ
Max
Unit
Condition
VTT
Output Termination Voltage
VCC ÷ 2
V
MM
ESD Protection (Machine Model)
200
V
HBM
ESD Protection (Human Body Model)
2000
V
CDM
ESD Protection (Charged Device Model)
1500
V
LU
Latch--Up Immunity
200
mA
CPD
Power Dissipation Capacitance
10
pF
Per output
CIN
Input Capacitance
4.0
pF
Inputs
Table 5: ABSOLUTE MAXIMUM RATINGSa
Symbol
Characteristics
Min
Max
Unit
Condition
VCC
Supply Voltage
-0.3
3.6
V
VIN
DC Input Voltage
-0.3
VCC+0.3
V
VOUT
DC Output Voltage
-0.3
VCC+0.3
V
IIN
DC Input Current
±20
mA
IOUT
DC Output Current
±50
mA
TS
Storage Temperature
-65
125
°C
a. Absolute maximum continuous ratings are those maximum values beyond which damage to the device may occur. Exposure to these conditions
or conditions beyond those indicated may adversely affect device reliability. Functional operation at absolute-maximum-rated conditions is not
implied.
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