参数资料
型号: MT58L512L18FF-7.5IT
元件分类: SRAM
英文描述: 512K X 18 CACHE SRAM, 7.5 ns, PBGA165
封装: 13 X 15 MM, FBGA-165
文件页数: 10/27页
文件大小: 417K
代理商: MT58L512L18FF-7.5IT
18
8Mb: 512K x 18, 256K x 32/36 Flow-Through SyncBurst SRAM
Micron Technology, Inc., reserves the right to change products or specifications without notice.
MT58L512L18F_C.p65 – Rev. 2/02
2002, Micron Technology, Inc.
8Mb: 512K x 18, 256K x 32/36
FLOW-THROUGH SYNCBURST SRAM
FBGA CAPACITANCE
DESCRIPTION
CONDITIONS
SYMBOL
TYP
MAX
UNITS
NOTES
Address/Control Input Capacitance
CI
2.5
3.5
pF
1
Output Capacitance (Q)
TA = 25°C; f = 1 MHz
CO
45
pF
1
Clock Capacitance
CCK
2.5
3.5
pF
1
FBGA THERMAL RESISTANCE
DESCRIPTION
CONDITIONS
SYMBOL
TYP
UNITS NOTES
Junction to Ambient
Test conditions follow standard test methods
θ
JA
40
°C/W
1
(Airflow of 1m/s)
and procedures for measuring thermal
Junction to Case (Top)
impedance, per EIA/JESD51.
θ
JC
9
°C/W
1
Junction to Pins
θ
JB
17
°C/W
1
(Bottom)
TQFP THERMAL RESISTANCE
DESCRIPTION
CONDITIONS
SYMBOL
TYP
UNITS NOTES
Thermal Resistance
Test conditions follow standard test
1-layer
θ
JA
40
°C/W
1
(Junction to Ambient)
methods and procedures for measuring
Thermal Resistance
thermal impedance, per EIA/JESD51.
θ
JC
8
°C/W
1
(Junction to Top of Case)
NOTE: 1. This parameter is sampled.
2. Preliminary package data.
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