参数资料
型号: NTP75N06G
厂商: ON Semiconductor
文件页数: 1/8页
文件大小: 0K
描述: MOSFET N-CH 60V 75A TO220AB
产品变化通告: Product Obsolescence 01/Jul/2009
产品目录绘图: MOSFET TO-220, TO-220AB
标准包装: 50
FET 型: MOSFET N 通道,金属氧化物
FET 特点: 标准
漏极至源极电压(Vdss): 60V
电流 - 连续漏极(Id) @ 25° C: 75A
开态Rds(最大)@ Id, Vgs @ 25° C: 9.5 毫欧 @ 37.5A,10V
Id 时的 Vgs(th)(最大): 4V @ 250µA
闸电荷(Qg) @ Vgs: 130nC @ 10V
输入电容 (Ciss) @ Vds: 4510pF @ 25V
功率 - 最大: 2.4W
安装类型: 通孔
封装/外壳: TO-220-3
供应商设备封装: TO-220AB
包装: 管件
其它名称: NTP75N06GOS
NTP75N06, NTB75N06
Power MOSFET
75 Amps, 60 Volts, N?Channel
TO?220 and D 2 PAK
Designed for low voltage, high speed switching applications in
power supplies, converters and power motor controls and bridge
circuits.
Features
? Pb?Free Packages are Available
Typical Applications
http://onsemi.com
75 AMPERES, 60 VOLTS
R DS(on) = 9.5 m W
N?Channel
D
?
?
?
?
Power Supplies
Converters
Power Motor Controls
Bridge Circuits
G
MAXIMUM RATINGS (T J = 25 ° C unless otherwise noted)
S
Rating
Drain?to?Source Voltage
Symbol
V DSS
Value
60
Unit
Vdc
MARKING
DIAGRAMS
4
Drain?to?Gate Voltage (R GS = 10 M W )
Gate?to?Source Voltage
V DGR
60
Vdc
Vdc
4
Drain
? Continuous
? Non?Repetitive (t p v 10 ms)
V GS
V GS
" 20
" 30
Drain Current
? Continuous @ T A = 25 ° C
? Continuous @ T A = 100 ° C
? Single Pulse (t p v 10 m s)
I D
I D
I DM
75
50
225
Adc
Apk
TO?220
CASE 221A
STYLE 5
75N06
AYWW
Total Power Dissipation @ T A = 25 ° C
Derate above 25 ° C
Total Power Dissipation @ T A = 25 ° C
Operating and Storage Temperature Range
P D
T J , T stg
214
1.4
2.4
?55 to
+175
W
W/ ° C
W
° C
1
2
3
1
Gate
2
Drain
4
Drain
3
Source
Single Pulse Drain?to?Source Avalanche
Energy ? Starting T J = 25 ° C
(V DD = 50 Vdc, V GS = 10 Vdc, L = 0.3 mH
E AS
844
mJ
4
D 2 PAK
75N06
I L(pk) = 75 A, V DS = 60 Vdc)
CASE 418B
AYWW
Thermal Resistance
° C/W
2
STYLE 2
? Junction?to?Case
? Junction?to?Ambient
Maximum Lead Temperature for Soldering
Purposes, 1/8 ″ from case for 10 seconds
R q JC
R q JA
T L
0.7
62.5
260
° C
3
75N06
1
Gate
= Device Code
2
Drain
3
Source
Maximum ratings are those values beyond which device damage can occur.
Maximum ratings applied to the device are individual stress limit values (not
normal operating conditions) and are not valid simultaneously. If these limits
are exceeded, device functional operation is not implied, damage may occur
A
Y
WW
= Assembly Location
= Year
= Work Week
and reliability may be affected.
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 5 of this data sheet.
? Semiconductor Components Industries, LLC, 2004
August, 2004 ? Rev. 2
1
Publication Order Number:
NTP75N06/D
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