参数资料
型号: PF38F1020WYTQ1
厂商: INTEL CORP
元件分类: 存储器
英文描述: SPECIALTY MEMORY CIRCUIT, PBGA88
封装: 8 X 10 MM, 1.20 MM HEIGHT, 0.80 MM PITCH, LEAD FREE, SCSP-88
文件页数: 23/23页
文件大小: 364K
代理商: PF38F1020WYTQ1
32-Mbit W18 + 8-Mbit SRAM (38F1020W0YTQ1, 38F1020W0YBQ1)
Datasheet
Intel StrataFlash Wireless Memory (W18 SCSP)
28 Jun 2005
Order Number: 252635, Revision: 003
9
4.1
Signal Descriptions
Table 1 describes the active signals used on the 38F1020W0YQ1 devices.
Table 1.
Signal Descriptions (Sheet 1 of 2)
Symbol
Type
Name and Function
A[25:0]
Input
ADDRESS INPUTS: Decodes a specific location for reads or writes, or targets a
flash device block for erase. Flash memory addresses are latched during writes, and
for reads when ADV# (or CLK with ADV# low) is issued.
A[20:0] decodes a specific location within the 28F320W18 die.
A[18:0] decodes a specific location within the 8-Mbit SRAM.
A[25:21] is not used in this SCSP device and is Reserved for Future Use (RFU).
D[15:0]
Input/
Output
DATA INPUTS/OUTPUTS: Inputs data for SRAM writes or flash device
programming. Flash memory commands issued during CUI writes are input on
D[7:0] only.
D[15:0] outputs the device memory contents or flash device ID codes. D[15:0]
are floated when the device is deselected or the outputs are disabled.
Flash memory SRD is read on D[7:0] only.
Flash device I/Os D[15:8, 6:0] are floated when the flash device WSM is busy.
CE#1,
CE#2
Input
FLASH CHIP ENABLE:
CE#1-low selects the flash device.
When asserted, the flash device internal control logic, input buffers, decoders,
and
sense amplifiers are activated.
When deasserted, the flash die is deselected, power levels reduce to
standby, and data and WAIT outputs are placed in high-Z state.
CE#2 is not used in this SCSP device and is RFU.
S-CS1#,
S-CS2
Input
SRAM CHIP SELECTS: Activates the SRAM internal control logic, input buffers,
decoders, and sense amplifiers. When either are deasserted (S-CS1# = VIH or
S-CS2 = VIL), the SRAM is deselected and its power reduces to standby levels.
RST#
Input
FLASH RESET: RST#-low resets the flash device internal circuitry and inhibits write
operations. Use this function to protect data during power transitions. After exiting
the reset state (RST# returned to logic-high), the selected flash die resumes
operation in asynchronous read-array mode.
OE#1,
OE#2
Input
FLASH OUTPUT ENABLE: OE#1-low activates device output through the flash
memory device data buffers during a flash memory read cycle. When deasserted,
the flash device outputs tristate to high-Z.
OE#2 is not used in this SCSP device and is RFU.
R-OE#
Input
SRAM OUTPUT ENABLE: R-OE#-low activates device output through the SRAM
data buffers during a SRAM read cycle. When deasserted, the SRAM outputs tristate
to high-Z.
WE#
Input
FLASH WRITE ENABLE: WE# controls writes to the selected flash memory die.
WE#-low allows input to the flash device CUI, array, PR/PLR, RCR, or block lock
bits. Addresses and data latch on the signal rising edge.
R-WE#
Input
SRAM WRITE ENABLE: R-WE#-low allows writes to the SRAM array.
R-UB#,
R-LB#
Input
SRAM UPPER / LOWER BYTE ENABLES: R-UB#-low enables the SRAM
high-order bytes (D[15:8]). R-LB#-low enables the SRAM low-order bytes (D[7:0]).
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