参数资料
型号: 42S16400A
厂商: Integrated Silicon Solution, Inc.
英文描述: 1 Meg Bits x 16 Bits x 4 Banks (64-MBIT) SYNCHRONOUS DYNAMIC RAM
中文描述: 1梅格位× 16位× 4银行(64兆位)同步动态RAM
文件页数: 5/55页
文件大小: 472K
代理商: 42S16400A
IS42S16400A
ISSI
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774
13
Rev.C
04/16/03
AC ELECTRICAL CHARACTERISTICS (1,2,3)
-6
-7
- 1 0
Symbol Parameter
Min.
Max.
Min.
Max.
Min.
M a x
U nits
tCK3
Clock Cycle Time
CAS Latency = 3
6
7
10
ns
tCK2
CAS Latency = 2
10
10
ns
tAC3
Access Time From CLK(4)
CAS Latency = 3
6
6
7
ns
tAC2
CAS Latency = 2
9
9
9
ns
tCHI
CLK HIGH Level Width
2
2.5
3.5
ns
tCL
CLK LOW Level Width
2
2.5
3.5
ns
tOH3
Output Data Hold Time
CAS Latency = 3
2.5
2.5
2.5
ns
tOH2
CAS Latency = 2
2.5
2.5
2.5
ns
tLZ
Output LOW Impedance Time
0
0
0
ns
tHZ3
Output HIGH Impedance Time(5)
CAS Latency = 3
6
6
7
ns
tHZ2
CAS Latency = 2
9
9
9
ns
tDS
Input Data Setup Time
1.5
1.5
2.0
ns
tDH
Input Data Hold Time
0.8
0.8
1
ns
tAS
Address Setup Time
1.5
1.5
2.0
ns
tAH
Address Hold Time
0.8
0.8
1
ns
tCKS
CKE Setup Time
1.5
1.5
2.0
ns
tCKH
CKE Hold Time
0.8
0.8
1
ns
tCKA
CKE to CLK Recovery Delay Time
1CLK+3
1CLK+3
1CLK+3
—ns
tCS
CommandSetupTime(
CS,RAS,CAS,WE,DQM)1.5
1.5
2.0
ns
tCH
CommandHoldTime(
CS,RAS,CAS,WE,DQM) 0.8
0.8
1
ns
tRC
Command Period (REF to REF / ACT to ACT)
60
63
70
ns
tRAS
Command Period (ACT to PRE)
35
50,000
37
50,000
44
50,000
ns
tRP
Command Period (PRE to ACT)
16
16
18
ns
tRCD
Active Command To Read / Write Command Delay Time
16
16
18
ns
tRRD
Command Period (ACT [0] to ACT[1])
14
14
15
ns
tDPL3
Input Data To Precharge
CAS Latency = 3
2CLK
2CLK
2CLK
ns
Command Delay time
tDPL2
CAS Latency = 2
2CLK
2CLK
2CLK
ns
tDAL3
Input Data To Active / Refresh
CAS Latency = 3
2CLK+tRP
2CLK+tRP
2CLK+tRP
—ns
Command Delay time (During Auto-Precharge)
tDAL2
CAS Latency = 2
2CLK+tRP
2CLK+tRP
2CLK+tRP
—ns
tT
Transition Time
1
10
1
10
1
10
ns
tREF
Refresh Cycle Time (4096)
64
64
64
ms
Notes:
1. When power is first applied, memory operation should be started 100 s after Vcc and VccQ reach their stipulated voltages. Also
note that the power-on sequence must be executed before starting memory operation.
2. Measured with tT = 1 ns.
3. The reference level is 1.4 V when measuring input signal timing. Rise and fall times are measured between VIH (min.) and VIL
(max.).
4. Access time is measured at 1.4V with the load shown in the figure below.
5. The time tHZ (max.) is defined as the time required for the output voltage to transition by ± 200 mV from VOH (min.) or VOL (max.)
when the output is in the high impedance state.
相关PDF资料
PDF描述
42S16800A 16Meg x 8, 8Meg x16 & 4Meg x 32 128-MBIT SYNCHRONOUS DRAM
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4300-000 EMI/RFI FILTER Hermetically Sealed
4300-000LF
4300-001 EMI/RFI FILTER Hermetically Sealed
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