- 您现在的位置：买卖IC网 > PDF目录1986 > AD9258BCPZ-125 (Analog Devices Inc)IC ADC 14BIT 125MSPS DL 64LFCSP PDF资料下载
参数资料
| 型号： | AD9258BCPZ-125 |
| 厂商： | Analog Devices Inc |
| 文件页数： | 28/44页 |
| 文件大小： | 0K |
| 描述： | IC ADC 14BIT 125MSPS DL 64LFCSP |
| 设计资源： | High Performance, Dual Channel IF Sampling Receiver (CN0140) |
| 标准包装： | 1 |
| 位数： | 14 |
| 采样率（每秒）： | 125M |
| 数据接口： | 串行 |
| 转换器数目： | 2 |
| 功率耗散（最大）： | 788mW |
| 电压电源： | 模拟和数字 |
| 工作温度： | -40°C ~ 85°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 64-VFQFN 裸露焊盘，CSP |
| 供应商设备封装： | 64-LFCSP-VQ（9x9） |
| 包装： | 托盘 |
| 输入数目和类型： | 2 个差分，单极 |
第1页第2页第3页第4页第5页第6页第7页第8页第9页第10页第11页第12页第13页第14页第15页第16页第17页第18页第19页第20页第21页第22页第23页第24页第25页第26页第27页当前第28页第29页第30页第31页第32页第33页第34页第35页第36页第37页第38页第39页第40页第41页第42页第43页第44页
AD9258
Rev. A | Page 34 of 44
BUILT-IN SELF-TEST (BIST) AND OUTPUT TEST
The AD9258 includes built-in test features designed to enable
verification of the integrity of each channel as well as facilitate
board level debugging. A BIST (built-in self-test) feature is included
that verifies the integrity of the digital datapath of the AD9258.
Various output test options are also provided to place predictable
values on the outputs of the AD9258.
BUILT-IN SELF-TEST (BIST)
The BIST is a thorough test of the digital portion of the selected
AD9258 signal path. When enabled, the test runs from an internal
pseudorandom noise (PN) source through the digital datapath
starting at the ADC block output. The BIST sequence runs for
512 cycles and stops. The BIST signature value for Channel A or
Channel B is placed in Register 0x24 and Register 0x25. If one
channel is chosen, its BIST signature is written to the two registers.
If both channels are chosen, the results from Channel A are placed
in the BIST signature registers.
The outputs are not disconnected during this test, so the PN
sequence can be observed as it runs. The PN sequence can be
continued from its last value or reset from the beginning, based
on the value programmed in Register 0x0E, Bit 2. The BIST
signature result varies based on the channel configuration.
OUTPUT TEST MODES
The output test options are shown in Table 17. When an output
test mode is enabled, the analog section of the ADC is discon-
nected from the digital back end blocks, and the test pattern is run
through the output formatting block. Some of the test patterns are
subject to output formatting, and some are not. The seed value for
the PN sequence tests can be forced if the PN reset bits are used
to hold the generator in reset mode by setting Bit 4 or Bit 5 of
Register 0x0D. These tests can be performed with or without
an analog signal (if present, the analog signal is ignored), but
they do require an encode clock. For more information, see the
AN-877 Application Note, Interfacing to High Speed ADCs via SPI.
相关PDF资料 |
PDF描述 |
|---|---|
| AD9259ABCPZRL7-50 | IC ADC 14BIT SRL 50MSPS 48LFCSP |
| AD9260ASZRL | IC ADC 16BIT 2.5MHZ 44MQFP |
| AD9262BCPZ-10 | IC ADC 16BIT 10MHZ 64LFCSP |
| AD9266BCPZRL7-20 | IC ADC 16BIT 20MSPS 32LFCSP |
| AD9269BCPZRL7-20 | IC ADC 16BIT 20MSPS DL 64LFCSP |
相关代理商/技术参数 |
参数描述 |
|---|---|
| AD9258BCPZ-1251 | 制造商:AD 制造商全称:Analog Devices 功能描述:14-Bit, 80 MSPS/105 MSPS/125 MSPS, 1.8 V Dual Analog-to-Digital Converter (ADC) |
| AD9258BCPZ-80 | 功能描述:模数转换器 - ADC Dual 14 bit 80 high SNR ADC RoHS:否 制造商:Analog Devices 通道数量: 结构: 转换速率: 分辨率: 输入类型: 信噪比: 接口类型: 工作电源电压: 最大工作温度: 安装风格: 封装 / 箱体: |
| AD9258BCPZ-801 | 制造商:AD 制造商全称:Analog Devices 功能描述:14-Bit, 80 MSPS/105 MSPS/125 MSPS, 1.8 V Dual Analog-to-Digital Converter (ADC) |
| AD9258BCPZRL7-105 | 功能描述:模数转换器 - ADC Dual 14 bit 105 highSNR ADC RoHS:否 制造商:Analog Devices 通道数量: 结构: 转换速率: 分辨率: 输入类型: 信噪比: 接口类型: 工作电源电压: 最大工作温度: 安装风格: 封装 / 箱体: |
| AD9258BCPZRL7-1051 | 制造商:AD 制造商全称:Analog Devices 功能描述:14-Bit, 80 MSPS/105 MSPS/125 MSPS, 1.8 V Dual Analog-to-Digital Converter (ADC) |
发布紧急采购，3分钟左右您将得到回复。