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参数资料
| 型号： | IDT72V51246L6BB8 |
| 厂商： | IDT, Integrated Device Technology Inc |
| 文件页数： | 49/56页 |
| 文件大小： | 0K |
| 描述： | IC FLOW CTRL MULTI QUEUE 256-BGA |
| 标准包装： | 1,000 |
| 类型： | 多队列流量控制 |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 256-BBGA |
| 供应商设备封装： | 256-BGA（17x17） |
| 包装： | 带卷 (TR) |
| 其它名称： | 72V51246L6BB8 |
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53
COMMERCIALANDINDUSTRIAL
TEMPERATURERANGES
IDT72V51236/72V51246/72V51256 3.3V, MULTI-QUEUE FLOW-CONTROL DEVICES
(4 QUEUES) 36 BIT WIDE CONFIGURATION 589,824, 1,179,648 and 2,359,296 bits
THE INSTRUCTION REGISTER
TheInstructionregisterallowsaninstructiontobeshiftedinseriallyintothe
processor at the rising edge of TCLK.
The Instruction is used to select the test to be performed, or the test data
registertobeaccessed,orboth. Theinstructionshiftedintotheregisterislatched
at the completion of the shifting process when the TAP controller is at Update-
IRstate.
The instruction register must contain 4 bit instruction register-based cells
whichcanholdinstructiondata. Thesemandatorycellsarelocatednearestthe
serial outputs they are the least significant bits.
TEST DATA REGISTER
The Test Data register contains three test data registers: the Bypass, the
Boundary Scan register and Device ID register.
These registers are connected in parallel between a common serial input
and a common serial data output.
The following sections provide a brief description of each element. For a
completedescription,refertotheIEEEStandardTestAccessPortSpecification
(IEEE Std. 1149.1-1990).
TEST BYPASS REGISTER
The register is used to allow test data to flow through the device from TDI
toTDO. Itcontainsasinglestageshiftregisterforaminimumlengthinserialpath.
When the bypass register is selected by an instruction, the shift register stage
is set to a logic zero on the rising edge of TCLK when the TAP controller is in
the Capture-DR state.
The operation of the bypass register should not have any effect on the
operation of the device in response to the BYPASS instruction.
THE BOUNDARY-SCAN REGISTER
The Boundary Scan Register allows serial data TDI be loaded in to or read
out of the processor input/output ports. The Boundary Scan Register is a part
of the IEEE 1149.1-1990 Standard JTAG Implementation.
THE DEVICE IDENTIFICATION REGISTER
The Device Identification Register is a Read Only 32-bit register used to
specify the manufacturer, part number and version of the processor to be
determined through the TAP in response to the IDCODE instruction.
IDT JEDEC ID number is 0xB3. This translates to 0x33 when the parity
is dropped in the 11-bit Manufacturer ID field.
For the IDT72V51236/72V51246/72V51256, the Part Number field con-
tains the following values:
Device
Part# Field (HEX)
IDT72V51236
0x41B
IDT72V51246
0x41C
IDT72V51256
0x41D
JTAG INSTRUCTION REGISTER
TheInstructionregisterallowsinstructiontobeseriallyinputintothedevice
when the TAP controller is in the Shift-IR state. The instruction is decoded to
perform the following:
Select test data registers that may operate while the instruction is
current. The other test data registers should not interfere with chip
operation and the selected data register.
Definetheserialtestdataregisterpaththatisusedtoshiftdatabetween
TDI and TDO during data register scanning.
The Instruction Register is a 4 bit field (i.e. IR3, IR2, IR1, IR0) to decode
16 different possible instructions. Instructions are decoded as follows.
JTAG INSTRUCTION REGISTER DECODING
Hex
Instruction
Function
Value
00
EXTEST
Select Boundary Scan Register
01
SAMPLE/PRELOAD
Select Boundary Scan Register
02
IDCODE
SelectChipIdentificationdataregister
04
HIGH-IMPEDANCE
JTAG
0F
BYPASS
Select Bypass Register
The following sections provide a brief description of each instruction. For
acompletedescriptionrefertotheIEEEStandardTestAccessPortSpecification
(IEEE Std. 1149.1-1990).
EXTEST
The required EXTEST instruction places the IC into an external boundary-
testmodeandselectstheboundary-scanregistertobeconnectedbetweenTDI
and TDO. During this instruction, the boundary-scan register is accessed to
drive test data off-chip via the boundary outputs and receive test data off-chip
via the boundary inputs. As such, the EXTEST instruction is the workhorse of
IEEE. Std 1149.1, providing for probe-less testing of solder-joint opens/shorts
and of logic cluster function.
IDCODE
TheoptionalIDCODEinstructionallowstheICtoremaininitsfunctionalmode
andselectstheoptionaldeviceidentificationregistertobeconnectedbetween
TDI and TDO. The device identification register is a 32-bit shift register
containinginformationregardingtheICmanufacturer,devicetype,andversion
code. Accessing the device identification register does not interfere with the
operation of the IC. Also, access to the device identification register should be
immediately available, via a TAP data-scan operation, after power-up of the
IC or after the TAP has been reset using the optional
TRSTpinorbyotherwise
moving to the Test-Logic-Reset state.
SAMPLE/PRELOAD
The required SAMPLE/PRELOAD instruction allows the IC to remain in a
normalfunctionalmodeandselectstheboundary-scanregistertobeconnected
betweenTDIandTDO.Duringthisinstruction,theboundary-scanregistercan
be accessed via a date scan operation, to take a sample of the functional data
entering and leaving the IC. This instruction is also used to preload test data
into the boundary-scan register before loading an EXTEST instruction.
JTAG DEVICE IDENTIFICATION REGISTER
31(MSB)
28 27
12 11
1 0(LSB)
Version (4 bits)
Part Number (16-bit) Manufacturer ID (11-bit)
0X0
0X33
1
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| IDT72V51246L7-5BB | 功能描述:IC FLOW CTRL MULTI QUEUE 256-BGA RoHS:否 类别:集成电路 (IC) >> 专用 IC 系列:- 产品培训模块:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 标准包装:1 系列:- 类型:调帧器 应用:数据传输 安装类型:表面贴装 封装/外壳:400-BBGA 供应商设备封装:400-PBGA（27x27） 包装:散装 |
| IDT72V51246L7-5BB8 | 功能描述:IC FLOW CTRL MULTI QUEUE 256-BGA RoHS:否 类别:集成电路 (IC) >> 专用 IC 系列:- 产品培训模块:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 标准包装:1 系列:- 类型:调帧器 应用:数据传输 安装类型:表面贴装 封装/外壳:400-BBGA 供应商设备封装:400-PBGA（27x27） 包装:散装 |
| IDT72V51246L7-5BBI | 功能描述:IC FLOW CTRL MULTI QUEUE 256-BGA RoHS:否 类别:集成电路 (IC) >> 专用 IC 系列:- 产品培训模块:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 标准包装:1 系列:- 类型:调帧器 应用:数据传输 安装类型:表面贴装 封装/外壳:400-BBGA 供应商设备封装:400-PBGA（27x27） 包装:散装 |
| IDT72V51253L6BB | 功能描述:IC FLOW CTRL MULTI QUEUE 256-BGA RoHS:否 类别:集成电路 (IC) >> 专用 IC 系列:- 产品培训模块:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 标准包装:1 系列:- 类型:调帧器 应用:数据传输 安装类型:表面贴装 封装/外壳:400-BBGA 供应商设备封装:400-PBGA（27x27） 包装:散装 |
| IDT72V51253L6BB8 | 功能描述:IC FLOW CTRL MULTI QUEUE 256-BGA RoHS:否 类别:集成电路 (IC) >> 专用 IC 系列:- 产品培训模块:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 标准包装:1 系列:- 类型:调帧器 应用:数据传输 安装类型:表面贴装 封装/外壳:400-BBGA 供应商设备封装:400-PBGA（27x27） 包装:散装 |
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