参数资料
型号: MC33910G5AC
厂商: Freescale Semiconductor
文件页数: 61/90页
文件大小: 0K
描述: IC SYSTEM BASIS CHIP 32LQFP
标准包装: 250
应用: 系统基础芯片
电流 - 电源: 4.5mA
电源电压: 5.5 V ~ 27 V
工作温度: -40°C ~ 125°C
安装类型: 表面贴装
封装/外壳: 32-LQFP
供应商设备封装: 32-LQFP(7x7)
包装: 托盘
MC33910BAC / MC34910BAC
ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
Table 34. Dynamic Electrical Characteristics (continued)
Characteristics noted under conditions 5.5 V ≤ V SUP ≤ 18 V, -40°C ≤ T A ≤ 125°C for the 33910 and -40°C ≤ T A ≤ 85°C for the
34910, unless otherwise noted. Typical values noted reflect the approximate parameter mean at T A = 25°C under nominal
conditions, unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
LIN PHYSICAL LAYER: DRIVER CHARACTERISTICS FOR FAST SLEW RATE
LIN Fast Slew Rate (Programming mode)
SR FAST
20
V / μ s
LIN PHYSICAL LAYER: CHARACTERISTICS AND WAKE-UP TIMINGS
Propagation Delay and Symmetry (113)
μ s
Propagation Delay Receiver, t REC_PD =max (t REC_PDR , t REC_PDF )
Symmetry of Receiver Propagation Delay t REC_PDF - t REC_PDR
t REC_PD
t REC_SYM
- 2.0
3.0
6.0
2.0
Bus Wake-up Deglitcher (Sleep and Stop
modes) (114)
t PROPWL
42
70
95
μ s
Bus Wake-up Event Reported
μ s
From Sleep mode
t WAKE
1500
From Stop mode (116)
t WAKE
9.0
13
17
TXD Permanent Dominant State Delay
t TXDDOM
0.65
1.0
1.35
s
PULSE WIDTH MODULATION INPUT PIN (PWMIN)
PWMIN pin (117)
f PWMIN
kHz
Max. frequency to drive HS output pins
10
Notes
112. V SUP from 7.0 V to 18 V, bus load R BUS and C BUS 1.0 nF / 1.0 k Ω , 6.8 nF / 660 Ω , 10 nF / 500 Ω . Measurement thresholds: 50% of TXD
signal to LIN signal threshold defined at each parameter. See Figure 6 .
113. See Figure 9 .
114. See Figure 10 , for Sleep and Figure 11 , for Stop mode.
115. The measurement is done with 1.0 μF capacitor and 0 mA current load on V DD . The value takes into account the delay to charge the
capacitor. The delay is measured between the bus wake-up threshold (V BUSWU ) rising edge of the LIN bus and when V DD reaches 3.0 V.
See Figure 10 . The delay depends of the load and capacitor on V DD .
116.
117.
In Stop mode, the delay is measured between the bus wake-up threshold (V BUSWU ) and the falling edge of the IRQ pin. See Figure 11 .
This parameter is guaranteed by process monitoring but, not production tested.
33910
Analog Integrated Circuit Device Data
61
Freescale Semiconductor
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