参数资料
型号: SI3529DV-T1-GE3
厂商: Vishay Siliconix
文件页数: 3/16页
文件大小: 0K
描述: MOSFET N/P-CH 40V 6-TSOP
标准包装: 3,000
系列: TrenchFET®
FET 型: N 和 P 沟道
FET 特点: 逻辑电平门
漏极至源极电压(Vdss): 40V
电流 - 连续漏极(Id) @ 25° C: 2.5A,1.95A
开态Rds(最大)@ Id, Vgs @ 25° C: 125 毫欧 @ 2.2A,10V
Id 时的 Vgs(th)(最大): 3V @ 250µA
闸电荷(Qg) @ Vgs: 7nC @ 10V
输入电容 (Ciss) @ Vds: 205pF @ 20V
功率 - 最大: 1.4W
安装类型: 表面贴装
封装/外壳: 6-TSOP(0.065",1.65mm 宽)
供应商设备封装: 6-TSOP
包装: 带卷 (TR)
Si3529DV
Vishay Siliconix
SPECIFICATIONS T J = 25 °C, unless otherwise noted
Parameter
Symbol
Test Conditions
Min.
Typ. a
Max.
Unit
Dynamic a
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
t d(on)
t r
t d(off)
N-Channel
V DD = 20 V, R L = 4 Ω
I D ? 1 A, V GEN = 10 V, R g = 1 Ω
P-Channel
V DD = - 20 V, R L = 4 Ω
N-Ch
P-Ch
N-Ch
P-Ch
N-Ch
P-Ch
2.5
5
12.5
12.5
8
10
4
7.5
20
20
12
15
Fall Time
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
t f
t d(on)
t r
t d(off)
t f
I D ? - 1 A, V GEN = - 10 V, R g = 1 Ω
N-Channel
V DD = 20 V, R L = 4 Ω
I D ? 1 A, V GEN = 4.5 V, R g = 1 Ω
P-Channel
V DD = - 20 V, R L = 4 Ω
I D ? - 1 A, V GEN = - 4.5 V, R g = 16 Ω
N-Ch
P-Ch
N-Ch
P-Ch
N-Ch
P-Ch
N-Ch
P-Ch
N-Ch
P-Ch
6.0
7.5
13
23
65
38
5
20
8
16
9
12
20
35
100
60
7.5
30
12
25
ns
Drain-Source Body Diode Characteristics
Pulse Diode Forward Current
Continuous Source-Drain Diode Current
a
I S
I SM
T C = 25 °C
N-Ch
P-Ch
N-Ch
P-Ch
1.05
- 1.05
10
-6
A
Body Diode Voltage
Body Diode Reverse Recovery Time
Body Diode Reverse Recovery Charge
Reverse Recovery Fall Time
Reverse Recovery Rise Time
V SD
t rr
Q rr
t a
t b
I S = 1.0 A
N-Channel
I F = 2 A, dI/dt = 100 A/μs, T J = 25 °C
P-Channel
I F = - 2 A, dI/dt = - 100 A/μs, T J = 25 °C
N-Ch
P-Ch
N-Ch
P-Ch
N-Ch
P-Ch
N-Ch
P-Ch
N-Ch
P-Ch
0.8
- 0.8
20
26
20
22
17
12
3
14
1.2
- 1.2
40
40
30
35
V
ns
nC
ns
Notes:
a. Guaranteed by design, not subject to production testing.
b. Pulse test; pulse width ≤ 300 μs, duty cycle ≤ 2 %.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
Document Number: 73455
S09-2277-Rev. C, 02-Nov-09
www.vishay.com
3
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