参数资料
型号: X45620V20I-2.7
厂商: Intersil
文件页数: 5/20页
文件大小: 0K
描述: IC VOLT MON DUAL SW EEPR 20TSSOP
标准包装: 75
类型: 多压监控器
监视电压数目: 2
输出: 开路漏极或开路集电极
复位: 低有效
复位超时: 最小为 75 ms
电压 - 阀值: 1.75V,2.62V
工作温度: -40°C ~ 85°C
安装类型: 表面贴装
封装/外壳: 20-TSSOP(0.173",4.40mm 宽)
供应商设备封装: 20-TSSOP
包装: 管件
X45620
D.C. OPERATING CHARACTERISTICS (CONTINUED)
(Over recommended operating conditions unless otherwise specified)
Limits
Symbol
V OLR
Parameter
Output (RESET, LOWLINE, WDO,
Min
Typ (6)
Max
0.4
Unit
V
Test Conditions
I OL = 3.0mA (5V)
V2FAIL) LOW Voltage
Two Wire Interface
I OL = 1.0mA (3V)
V IL
Input (SDA, S0, S1, SCL, WP) LOW
-0.5
V CC x 0.3
V
Note 3
Voltage
V IH
Input (SDA, S0, S1, SCL, WP) HIGH
V CC x 0.7
V CC + 0.5
V
Note 3
Voltage
I LI
Input Leakage Current (SDA, S1, S0,
±10
μA
SCL, WP)
V OLS
Output (SDA) LOW Voltage
0.4
V
I OL = 3.0mA (5V)
I OL = 1.0mA (3V), Note 4
Notes: (1) The device enters the Active state after any start, and remains active until 9 clock cycles later if the Device Select Bits in the Slave
Address Byte are incorrect; 200ns after a stop ending a read operation; or t WC after a stop ending a write operation.
(2) The device goes into Standby: 200ns after any Stop, except those that initiate a high voltage write cycle; t WC after a stop that initiates a
high voltage cycle; or 9 clock cycles after any start that is not followed by the correct Device Select Bits in the Slave Address Byte.
(3) V IL min. and V IH max. are for reference only and are not tested.
(4) This parameter is guaranteed by characterization.
CAPACITANCE T A = +25°C, f = 1MHz, V CC = 5V
Symbol
C OUT
Test
Output Capacitance (SDA, RESET, V2FAIL, LOWLINE, BATT-ON, WDO)
Max
8
Unit
pF
Conditions
V OUT = 0V,
Note 1, 4
C IN
Input Capacitance (SDA, SCL, S0, S1, WP)
6
pF
V IN = 0V,
Note 1, 4
EQUIVALENT A.C. LOAD CIRCUIT AT 5V V CC
A.C. TEST CONDITIONS
SDA
V CC
1.53k ?
BATT-ON
V CC
1.53k ?
Input pulse levels
Input rise and fall times
Input and output timing level
V CC x 0.1 to V CC x 0.9
10ns
V CC x 0.5
RESET
V2FAIL
LOWLINE
30pF
30pF
4481 ?
WDO
5
FN8250.0
July 29, 2005
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