参数资料
型号: XCV812E-7BG560C
厂商: Xilinx Inc
文件页数: 54/118页
文件大小: 0K
描述: IC FPGA 1.8V C-TEMP 560-MBGA
产品变化通告: FPGA Family Discontinuation 18/Apr/2011
标准包装: 1
系列: Virtex®-E EM
LAB/CLB数: 4704
逻辑元件/单元数: 21168
RAM 位总计: 1146880
输入/输出数: 404
门数: 254016
电源电压: 1.71 V ~ 1.89 V
安装类型: 表面贴装
工作温度: 0°C ~ 85°C
封装/外壳: 560-LBGA,金属
供应商设备封装: 560-MBGA(42.5x42.5)
Virtex-E 1.8 V Extended Memory Field Programmable Gate Arrays
Module 2 of 4
DS025-2 (v3.0) March 21, 2014
36
R
— OBSOLETE — OBSOLETE — OBSOLETE — OBSOLETE —
The LVTTL OBUFT additionally can support one of two slew
rate modes to minimize bus transients. By default, the slew
rate for each output buffer is reduced to minimize power bus
transients when switching non-critical signals.
LVTTL
3-state
output
buffers
have
selectable
drive
strengths.
The format for LVTTL OBUFT symbol names is as follows.
OBUFT_<slew_rate>_<drive_strength>
<slew_rate> can be either F (Fast), or S (Slow) and
<drive_strength> is specified in milliamps (2, 4, 6, 8, 12, 16,
or 24).
The following list details variations of the OBUFT symbol.
OBUFT
OBUFT_S_2
OBUFT_S_4
OBUFT_S_6
OBUFT_S_8
OBUFT_S_12
OBUFT_S_16
OBUFT_S_24
OBUFT_F_2
OBUFT_F_4
OBUFT_F_6
OBUFT_F_8
OBUFT_F_12
OBUFT_F_16
OBUFT_F_24
OBUFT_LVCMOS2
OBUFT_PCI33_3
OBUFT_PCI66_3
OBUFT_GTL
OBUFT_GTLP
OBUFT_HSTL_I
OBUFT_HSTL_III
OBUFT_HSTL_IV
OBUFT_SSTL3_I
OBUFT_SSTL3_II
OBUFT_SSTL2_I
OBUFT_SSTL2_II
OBUFT_CTT
OBUFT_AGP
OBUFT_LVCMOS18
OBUFT_LVDS
OBUFT_LVPECL
The Virtex-E series supports eight banks for the HQ and PQ
packages. The CS package supports four VCCO banks.
The SelectI/O OBUFT placement restrictions require that
within a given VCCO bank each OBUFT share the same out-
put source drive voltage. Input buffers of any type and out-
put buffers that do not require VCCO can be placed within
the same VCCO bank.
The LOC property can specify a location for the OBUFT.
3-state output buffers and bidirectional buffers can have
either a weak pull-up resistor, a weak pull-down resistor, or
a weak “keeper” circuit. Control this feature by adding the
appropriate symbol to the output net of the OBUFT (PUL-
LUP, PULLDOWN, or KEEPER).
The weak “keeper” circuit requires the input buffer within the
IOB to sample the I/O signal. So, OBUFTs programmed for
an I/O standard that requires a VREF have automatic place-
ment of a VREF in the bank with an OBUFT configured with
a weak “keeper” circuit. This restriction does not affect most
circuit design as applications using an OBUFT configured
with a weak “keeper” typically implement a bidirectional I/O.
In this case the IBUF (and the corresponding VREF) are
explicitly placed.
The LOC property can specify a location for the OBUFT.
IOBUF
Use the IOBUF symbol for bidirectional signals that require
both an input buffer and a 3-state output buffer with an
active high 3-state pin. The generic input/output buffer
IOBUF appears in Figure 42.
The extension to the base name defines which I/O standard
the IOBUF uses. With no extension specified for the generic
IOBUF symbol, the assumed standard is LVTTL input buffer
and slew rate limited LVTTL with 12 mA drive strength for
the output buffer.
The LVTTL IOBUF additionally can support one of two slew
rate modes to minimize bus transients. By default, the slew
rate for each output buffer is reduced to minimize power bus
transients when switching non-critical signals.
LVTTL bidirectional buffers have selectable output drive
strengths.
The format for LVTTL IOBUF symbol names is as follows.
IOBUF_<slew_rate>_<drive_strength>
<slew_rate> can be either F (Fast), or S (Slow) and
<drive_strength> is specified in milliamps (2, 4, 6, 8, 12, 16,
or 24).
Figure 41: 3-State Output Buffer Symbol (OBUFT)
O
I
OBUFT
x133_05_111699
T
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