参数资料
型号: AD5522JSVDZ
厂商: Analog Devices Inc
文件页数: 16/64页
文件大小: 0K
描述: IC PMU QUAD 16BIT DAC 80-TQFP
产品变化通告: Improve FI ac crosstalk
设计资源: Parametric Measurement Unit and Supporting Components for PAD Appls Using AD5522 and AD7685 (CN0104)
标准包装: 1
类型: 每引脚参数测量单元(PPMU)
应用: 自动测试设备
安装类型: 表面贴装
封装/外壳: 80-TQFP 裸露焊盘
供应商设备封装: 80-TQFP(12x12)
包装: 托盘
产品目录页面: 798 (CN2011-ZH PDF)
Data Sheet
AD5522
Rev. E | Page 23 of 64
0.005
–0.003
–0.002
–0.001
0
0.001
0.002
0.003
0.004
0
10,000
20,000
30,000
40,000
50,000
60,000
L
INE
ARI
T
Y
(
%
F
S
R)
CODE
06197-
142
AVDD = +15.5V, AVSS = –15.5V,
OFFSET DAC = 0xA492
AVDD = +28V, AVSS = –5V,
OFFSET DAC = 0x0
AVDD = +10V, AVSS = –23V,
OFFSET DAC = 0xED87
Figure 16. Measure Current Linearity vs. Code, All Ranges,
MEASOUTx Gain = 0.2, MI Gain = 5
1.0
0.8
0.6
0.4
0.2
0
–0.2
25
35
45
55
65
75
85
95
06197-
014
L
E
AKAG
E
CURRE
NT
(
n
A)
TEMPERATURE (°C)
EXTFOHx
CFFx
FOHx
EXTMEASIHx
EXTMEASILx
MEASVHx
GUARDINx/DUTGNDx
COMBINED LEAKAGE
V = 0V
Figure 17. Leakage Current vs. Temperature (Stress Voltage = 0 V)
2.0
1.5
1.0
0.5
0
–0.5
25
35
45
55
65
75
85
95
06197-
015
L
E
AKAG
E
CURRE
NT
(
n
A)
TEMPERATURE (°C)
EXTFOHx
CFFx
FOHx
EXTMEASIHx
EXTMEASILx
MEASVHx
GUARDINx/DUTGNDx
COMBINED LEAKAGE
V = 12V
Figure 18. Leakage Current vs. Temperature (Stress Voltage = 12 V)
0.2
0
–0.2
–0.4
–0.6
–0.8
–1.0
–1.2
25
35
45
55
65
75
85
95
06197-
016
L
E
AKAG
E
CURRE
NT
(
n
A)
TEMPERATURE (°C)
EXTFOHx
CFFx
FOHx
EXTMEASIHx
EXTMEASILx
MEASVHx
GUARDINx/DUTGNDx
COMBINED LEAKAGE
V = –12V
Figure 19. Leakage Current vs. Temperature (Stress Voltage = 12 V)
0.15
0.10
0.05
0
–0.05
–0.10
–0.15
–0.20
–12 –10
–8
–6
–4
–2
0
2
4
6
8
10
12
06197-
017
L
E
AKAG
E
CURRE
NT
(
n
A)
STRESS VOLTAGE (V)
EXTFOHx
CFFx
FOHx
EXTMEASIHx
EXTMEASILx
MEASVHx
GUARDINx/DUTGNDx
COMBINED LEAKAGE
TA = 25°C
Figure 20. Leakage Current vs. Stress Voltage
0
–20
–40
–60
–80
–100
–120
10
10M
100
ACP
S
RR
(
d
B)
10k
100k
1M
1k
FREQUENCY (Hz)
06197-
018
AVDD ACPSRR
AVSS ACPSRR
DVCC ACPSRR
Figure 21. ACPSRR at FOHx in Force Voltage Mode vs. Frequency
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