参数资料
型号: ADSP-21161NCCAZ100
厂商: Analog Devices Inc
文件页数: 50/60页
文件大小: 0K
描述: IC DSP CONTROLLER 32BIT 225MBGA
产品培训模块: SHARC Processor Overview
标准包装: 1
系列: SHARC®
类型: 浮点
接口: 主机接口,连接端口,串行端口
时钟速率: 100MHz
非易失内存: 外部
芯片上RAM: 128kB
电压 - 输入/输出: 3.30V
电压 - 核心: 1.80V
工作温度: -40°C ~ 105°C
安装类型: 表面贴装
封装/外壳: 225-BGA,CSPBGA
供应商设备封装: 225-CSPBGA(17x17)
包装: 托盘
其它名称: ADSP21161NCCAZ100
Rev. C
|
Page 54 of 60
|
January 2013
OUTPUT DRIVE CURRENTS
Figure 34 shows typical I-V characteristics for the output driv-
ers of the ADSP-21161N. The curves represent the current drive
capability of the output drivers as a function of output voltage.
TEST CONDITIONS
The DSP is tested for output enable, disable, and hold time.
Output Enable Time
Output pins are considered to be enabled when they have made
a transition from a high impedance state to the point when they
start driving. The output enable time tENA is the interval from
the point when a reference signal reaches a high or low voltage
level to the point when the output has reached a specified high
or low trip point, as shown in the Output Enable/Disable dia-
gram (Figure 35). If multiple pins (such as the data bus) are
enabled, the measurement value is that of the first pin to start
driving.
Output Disable Time
Output pins are considered to be disabled when they stop driv-
ing, go into a high-impedance state, and start to decay from
their output high or low voltage. The time for the voltage on the
bus to decay by V is dependent on the capacitive load, CL and
the load current, IL. This decay time can be approximated by the
following equation:
tDECAY = (CLV)/IL
The output disable time tDIS is the difference between tMEASURED
and tDECAY as shown in Figure 35. The time tMEASURED is the inter-
val from when the reference signal switches to when the output
voltage decays V from the measured output high or output low
voltage. tDECAY is calculated with test loads CL and IL, and with
V equal to 0.5 V.
Example System Hold Time Calculation
To determine the data output hold time in a particular system,
first calculate tDECAY using the equation given above. Choose V
to be the difference between the ADSP-21161N’s output voltage
and the input threshold for the device requiring the hold time. A
typical V will be 0.4 V. CL is the total bus capacitance (per data
line), and IL is the total leakage or three-state current (per data
line). The hold time will be tDECAY plus the minimum disable
time (i.e., tDATRWH for the write cycle).
Figure 34. Typical Drive Currents
SWEEP (VDDEXT) VOLTAGE – V
60
–10
–40
0
3.5
0.5
1.0
1.5
2.0
2.5
3.0
50
0
–20
–30
30
10
40
20
–50
–60
L
O
A
D
(V
D
E
X
T
)
C
U
R
E
N
T
m
A
VDDEXT = 3.47V, –40°C
VDDEXT = 3.3V, +25°C
VDDEXT = 3.13V, +105°C
VDDEXT = 3.47V, –40°C
VDDEXT = 3.3V, +25°C
80
–80
Figure 35. Output Enable/Disable
Figure 36. Equivalent Device Loading for AC
Measurements (Includes All Fixtures)
Figure 37. Voltage Reference Levels for AC
Measurements (Except Output Enable/Disable)
REFERENCE
SIGNAL
tDIS
OUTPUT STARTS DRIVING
VOH (MEASURED) – V
VOL (MEASURED) + V
tMEASURED
VOH
(MEASURED)
VOL
(MEASURED)
2.0V
1.0V
VOH
(MEASURED)
VOL
(MEASURED)
HIGH IMPEDANCE STATE.
TESTCONDITIONS CAUSETHIS
VOLTAGE TO BE APPROXIMATELY 1.5V.
OUTPUT STOPS DRIVING
tENA
tDECAY
1.5V
30pF
TO
OUTPUT
PIN
50
INPUT
OR
OUTPUT
1.5V
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