参数资料
型号: FDS2572
厂商: Fairchild Semiconductor
文件页数: 2/12页
文件大小: 0K
描述: MOSFET N-CH 150V 4.9A 8-SOIC
产品培训模块: High Voltage Switches for Power Processing
产品变化通告: Mold Compound Change 12/Dec/2007
产品目录绘图: Power MOSFET, 8-SOP, SO-8
标准包装: 1
系列: UltraFET™
FET 型: MOSFET N 通道,金属氧化物
FET 特点: 逻辑电平门
漏极至源极电压(Vdss): 150V
电流 - 连续漏极(Id) @ 25° C: 4.9A
开态Rds(最大)@ Id, Vgs @ 25° C: 47 毫欧 @ 4.9A,10V
Id 时的 Vgs(th)(最大): 4V @ 250µA
闸电荷(Qg) @ Vgs: 38nC @ 10V
输入电容 (Ciss) @ Vds: 2050pF @ 25V
功率 - 最大: 2.5W
安装类型: 表面贴装
封装/外壳: 8-SOIC(0.154",3.90mm 宽)
供应商设备封装: 8-SOICN
包装: 标准包装
产品目录页面: 1604 (CN2011-ZH PDF)
其它名称: FDS2572DKR
Electrical Characteristics T A = 25°C unless otherwise noted
Symbol
Parameter
Test Conditions
Min
Typ
Max
Units
Off Characteristics
B VDSS
Drain to Source Breakdown Voltage
I D = 250 μ A, V GS = 0V
150
-
-
V
I DSS
I GSS
Zero Gate Voltage Drain Current
Gate to Source Leakage Current
V DS = 120V
V GS = 0V
V GS = ± 20V
T C = 150 o C
-
-
-
-
-
-
1
250
± 100
μ A
nA
On Characteristics
V GS(TH)
r DS(ON)
r DS(ON)
Gate to Source Threshold Voltage
Drain to Source On Resistance
Drain to Source On Resistance
V GS = V DS , I D = 250 μ A
I D = 4.9A, V GS = 10V
I D = 4.9A, V GS = 6V
2
-
-
-
0.040
0.044
4
0.047
0.053
V
?
?
Dynamic Characteristics
C ISS
C OSS
C RSS
R g
Q g(TOT)
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Gate Resistance
Total Gate Charge at 10V
V DS = 25V, V GS = 0V,
f = 1MHz
V GS = 0V to 10V
-
-
-
0.1
-
2050
220
48
1.3
29
2870
310
80
3.0
38
pF
pF
pF
?
nC
Q g(TH)
Q gs
Q gd
Q gs2
Threshold Gate Charge
Gate to Source Gate Charge
Gate to Drain “Miller” Charge
Gate Charge Threshold to Plateau
V GS = 0V to 2V
V DD = 75V
I D = 4.9A
I g = 1.0mA
-
-
-
-
4
8
6
4
6
-
-
-
nC
nC
nC
nC
Switching Characteristics
t ON
t d(ON)
Turn-On Time
Turn-On Delay Time
-
-
-
14
27
-
ns
ns
t r
t d(OFF)
t f
t OFF
Rise Time
Turn-Off Delay Time
Fall Time
Turn-Off Time
V DD = 75V, I D = 4.9A
V GS = 10V, R G = 10 ?
-
-
-
-
4
44
22
-
-
-
-
100
ns
ns
ns
ns
Drain-Source Diode Characteristics
V SD
t rr
Q RR
Source to Drain Diode Voltage
Reverse Recovery Time
Reverse Recovered Charge
I SD = 4.9A
I SD = 3.1A
I SD = 4.9A, dI SD /dt =100A/ μ s
I SD = 4.9, dI SD /dt =100A/ μ s
-
-
-
-
-
-
-
-
1.25
1.0
72
158
V
V
ns
nC
Notes:
1. R θ JA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal referance is defined as the solder mounting surface of the
drain pins. R θ JC is guaranteed by design while R θ CA is determined by the user’s board design.
2. R θ JA is measured with 1.0in 2 copper on FR-4 board
?2001 Fairchild Semiconductor Corporation
FDS2572 Rev. C, July 2013
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FDS2582 制造商:Fairchild Semiconductor Corporation 功能描述:MOSFET N SO-8
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