参数资料
型号: KMPC8360EZUAJDG
厂商: Freescale Semiconductor
文件页数: 83/95页
文件大小: 0K
描述: IC MPU PWRQUICC II 740-TBGA
标准包装: 2
系列: MPC83xx
处理器类型: 32-位 MPC83xx PowerQUICC II Pro
速度: 533MHz
电压: 1.2V
安装类型: 表面贴装
封装/外壳: 740-LBGA
供应商设备封装: 740-TBGA(37.5x37.5)
包装: 托盘
MPC8358E PowerQUICC II Pro Processor Revision 2.1 PBGA Silicon Hardware Specifications, Rev. 3
84
Freescale Semiconductor
Thermal
To configure the device with CSB clock rate of 266 MHz, core rate of 400 MHz, and QUICC
Engine clock rate 300 MHz while the input clock rate is 33 MHz. Conf No. ‘s10’ and ‘c1’ are
selected from Table 74. SPMF is 1000, CORPLL is 0000011, CEPMF is 01001, and CEPDF is 0.
23 Thermal
This section describes the thermal specifications of the MPC8358E.
23.1
Thermal Characteristics
Table 75 provides the package thermal characteristics for the 668 29 mm x 29 mm PBGA package.
23.2
Thermal Management Information
For the following sections, PD = (VDD × IDD) + PI/O where PI/O is the power dissipation of the I/O drivers.
See Table 5 for typical power dissipations values.
Table 75. Package Thermal Characteristics for the PBGA Package
Characteristic
Symbol
Value
Unit
Notes
Junction-to-ambient Natural Convection on single layer board (1s)
RθJA
20
°C/W
1, 2
Junction-to-ambient Natural Convection on four layer board (2s2p)
RθJA
14
°C/W
1, 2, 3
Junction-to-ambient (@1 m/s) on single layer board (1s)
RθJMA
15
°C/W
1, 3
Junction-to-ambient (@ 1 m/s) on four layer board (2s2p)
RθJMA
11
C/W
1, 3
Junction-to-board thermal
RθJB
6C/W
C/W
4
Junction-to-case thermal
RθJC
4C/W
C/W
5
Junction-to-Package Natural Convection on Top
ψJT
4C/W
C/W
6
Notes
1. Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site
(board) temperature, ambient temperature, air flow, power dissipation of other components on the board, and board
thermal resistance.
2. Per JEDEC JESD51-2 and JEDEC JESD51-9 with the single layer board horizontal.
3. Per JEDEC JESD51-6 with the board horizontal. 1 m/sec is approximately equal to 200 linear feet per minute (LFM).
4. Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is
measured on the top surface of the board near the package.
5. Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883
Method 1012.1).
6. Thermal characterization parameter indicating the temperature difference between package top and the junction
temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter
is written as Psi-JT.
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