Obsolete
Product(s)
- Obsolete
Product(s)
EMC characteristics
UPSD3254A, UPSD3254BV, UPSD3253B, UPSD3253BV
31.3
Absolute maximum ratings (electrical sensitivity)
Based on three different tests (ESD, LU, and DLU) and using specific measurement
methods, the product is stressed in order to determine its performance in terms of electrical
sensitivity. For more details, refer to the Application Note AN1181.
31.3.1
Electro-static discharge (ESD)
Electro-Static discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts*(n+1) supply pin). The Human
Body Model is simulated
(Table 111). This test complies with the JESD22-A114A Standard.
1.
Data based on characterization results, not tested in production.
1.
Data based on characterization results, not tested in production
31.3.2
Latch-up
3 complementary static tests are required on 10 parts to assess the latch-up performance. A
supply overvoltage (applied to each power supply pin) and a current injection (applied to
each input, output, and configurable I/O pin) are performed on each sample. This test
conforms to the EIA/JESD 78 IC Latch-up Standard (see
Table 112). For more details, refer
to the Application Note, AN1181.
31.3.3
Dynamic latch-up
Electro-static discharges (one positive then one negative test) are applied to each pin of 3
samples when the micro is running to assess the latch-up performance in dynamic mode.
Power supplies are set to the typical values, the oscillator is connected as near as possible
to the pins of the micro, and the component is put in reset mode. This test conforms to the
IEC 1000-4-2 and SAEJ1752/3 Standards (see
Table 112). For more details, refer to the
Application Note, AN1181.
1.
Class description: A Class is an STMicroelectronics internal specification. All of its limits are higher than the
JEDEC specifications. This means when a device belongs to “Class A,” it exceeds the JEDEC standard.
“Class B” strictly covers all of the JEDEC criteria (International standards).
Table 110.
EMS test results
Symbol
Parameter
Conditions
Level/Class (1)
VFESD
Voltage limits to be applied on any
I/O pin to induce a functional
disturbance
VDD = 4V; TA = 25°C; fOSC =
40MHz; WDT off complies with
IEC 1000-4-2
3C
Table 111.
ESD absolute maximum ratings
Symbol
Parameter
Conditions
Max. Value(1)
Unit
VESD(HBM)
Electro-static discharge voltage
(Human Body Model)
TA = 25°C
2000
V
Table 112.
Latch-up and dynamic latch-up electrical sensitivities
Symbol
Parameter
Conditions
Level/class (1)
LU
Static latch-up class
TA = 25°C
A
DLU
Dynamic latch-up class
VDD = 5 V; TA = 25°C; fOSC = 40 MHz
A