参数资料
型号: ZL2004EVK1
厂商: Intersil
文件页数: 37/42页
文件大小: 0K
描述: KIT EVAL FOR ZL2004
标准包装: 1
系列: *
ZL2004
The device can also be monitored continuously for any
number of power conversion parameters including but
not limited to the following:
ZL
XTEMP
100pF
2N3904
Input voltage
Output voltage
Output current
SGND
Discrete NPN
Internal junction temperature
XTEMP
μP
Temperature of an external device
Switching frequency
ZL
SGND
100pF
FPGA
DSP
ASIC
Duty cycle
The PMBus Host should respond to SALRT as
follows:
1. ZL device pulls SALRT Low.
2. PMBus Host detects that SALRT is now low,
performs transmission with Alert Response
Address to find which ZL device is pulling
SALRT low
3. PMBus Host talks to the ZL device that has
pulled SALRT low. The actions that the host
performs are up to the System Designer.
If multiple devices are faulting, SALRT will still be
low after doing the above steps and will require
Embedded Thermal Diode
Figure 21. External Temperature Monitoring
6.19 Snapshot ? Paramet er Capture
The ZL2004 offers a special mechanism that enables
the user to capture parametric data during normal
operation or following a fault. The Snapshot
functionality is enabled by setting bit 1 of
MISC_CONFIG to 1.
The Snapshot feature enables the user to read the
parameters listed in Table 25 via a block read transfer
transmission with the Alert Response
Address
through the SMBus. This can be done during normal
repeatedly until all faults are cleared.
Please refer to Application Note AN33 for details on
how to monitor specific parameters via the I 2 C/SMBus
interface.
6.18 Temperature Monitoring Using the XTEMP Pin
The ZL2004 supports measurement of an external
device temperature using either a thermal diode
integrated in a processor, FPGA or ASIC, or using a
discrete diode-connected 2N3904 NPN transistor.
Figure 21 illustrates the typical connections required.
37
operation, although it should be noted that reading the
22 bytes will occupy the SMBus for some time.
The SNAPSHOT_CONTROL command enables the
user to store the snapshot parameters to Flash memory
in response to a pending fault as well as to read the
stored data from Flash memory after a fault has
occurred. Table 26 describes the usage of this
command. Automatic writes to Flash memory
following a fault are triggered when any fault threshold
level is exceeded, provided that the specific fault’s
response is to shut down (writing to Flash memory is
not allowed if the device is configured to re-try
following the specific fault condition).
FN6846.3
February 15, 2011
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