参数资料
型号: ADUC7032BSTZ-88-RL
厂商: Analog Devices Inc
文件页数: 16/120页
文件大小: 0K
描述: IC MCU 96K FLASH DUAL 48LQFP
标准包装: 2,000
系列: MicroConverter® ADuC7xxx
核心处理器: ARM7
芯体尺寸: 16/32-位
速度: 20.48MHz
连通性: LIN,SPI,UART/USART
外围设备: POR,PSM,温度传感器,WDT
输入/输出数: 9
程序存储器容量: 96KB(48K x 16)
程序存储器类型: 闪存
RAM 容量: 1.5K x 32
电压 - 电源 (Vcc/Vdd): 3.5 V ~ 18 V
数据转换器: A/D 2x16b
振荡器型: 内部
工作温度: -40°C ~ 105°C
封装/外壳: 48-LQFP
包装: 带卷 (TR)
ADuC7032-8L
Rev. A | Page 112 of 120
ADuC7032-8L ON-CHIP DIAGNOSTICS
The ADuC7032-8L integrates multiple diagnostic support
circuits on-chip. These circuits allow the device to test core
digital functionality, and analog front-end and high voltage I/O
ports in-circuit.
ADC DIAGNOSTICS
Internal Test Voltage
The current channel can be configured to convert on an
internal 8.3 mV test voltage. On any gain range, the result
should be within ±2% of the expected result.
Internal Short Mode
The current and voltage input channels can also be shorted
internally. Converting on the internal short allows an
assessment of the internal ADC noise.
Internal Current Sources
Internal current sources can also be enabled on both current
and temperature channels. These current sources can be used
to determine external short-circuit or open-circuit conditions
in both external shunt or temperature sensor configurations.
HIGH VOLTAGE I/O DIAGNOSTICS
High Voltage I/O Readback
All high voltage I/O pins are supported with readback capa-
bility, which allows the detection of external short conditions.
High Voltage Current Detection
All high voltage I/O pins also have a high current detection
capability, allowing high-side connections to VBAT to be
detected and controlled.
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