参数资料
型号: CS61584A-IQ3Z
厂商: Cirrus Logic Inc
文件页数: 26/47页
文件大小: 0K
描述: IC LINE INTERFACE T1/E1 64LQFP
标准包装: 160
接口: 并行/串行
电源电压: 3.3V,5V
封装/外壳: 64-LQFP
供应商设备封装: 64-LQFP(10x10)
包装: 托盘
安装类型: 表面贴装
产品目录页面: 759 (CN2011-ZH PDF)
其它名称: 598-1713
CS61584A
32
DS261PP5
10.1
JTAG Data Registers (DR)
The test data registers are the Boundary-Scan Reg-
ister (BSR), the Device Identification Register
(DIR), and the Bypass Register (BR).
Boundary Scan Register: The BSR is connected in
parallel to all the digital I/O pins, and provides the
mechanism for applying/reading test patterns
to/from the board traces. The BSR is 62 bits long
and is initialized and read using the instruction
SAMPLE/PRELOAD. The bit ordering for the
BSR is the same as the top-view package pin out,
beginning with the LOS1 pin and moving counter-
clockwise to end with the PD1 pin as shown in Ta-
ble 10. Note that the analog, oscillator, power,
ground, CLKE/IPOL, and MODE pins are not in-
cluded as part of the boundary-scan register.
The input pins require one bit in the BSR and only
one J-TCK cycle is required to load test data for
each input pin.
The output pins have two bits in the BSR to define
output high, output low, or high impedance. The
first bit (shifted in first) selects between an output-
enabled state (bit set to 1) or high-impedance state
(bit set to 0). The second bit shifted in contains the
test data that may be output on the pin. Therefore,
two J-TCK cycles are required to load test data for
each output pin.
The bi-directional pins have three bits in the BSR
to define input, output high, output low, or high im-
pedance. The first bit shifted into the BSR config-
ures the output driver as high-impedance (bit set to
0) or active (bit set to 1). The second bit shifted into
the BSR sets the output value when the first bit is 1.
The third bit captures the value of the pin. This pin
may have its value set externally as an input (if the
first bit is 0) or set internally as an output (if the
first bit is 1). To configure a pad as an input, the J-
TDI pattern is 0X0. To configure a pad as an out-
put, the J-TDI pattern is 1X1. Therefore, three J-
TCK cycles are required to load test data for each
bi-directional pin.
When JTAG testing is conducted in Host mode, the
polarity of the INT pin is determined by the state of
the IPOL pin. The JTAG BSR should configure the
INT pin as an input in Hardware mode and as an
output in Host mode.
Device Identification Register: The DIR provides
the manufacturer, part number, and version of the
CS61584A. This information can be used to verify
that the proper version or revision number has been
used in the system under test. The DIR is 32 bits
long and is partitioned as shown in Table 11. Data
from the DIR is shifted out to J-TDO LSB first.
BSR Bits
Pin Name
Pad Type
0 - 2
LOS1, SAD6
bi-directional
3 - 5
TNEG1, AIS1
bi-directional
6
TPOS1, TDATA1
input
7TCLK1
input
8 - 9
RNEG1, BPV1
output
10 - 11
RPOS1, RDATA1
output
12 - 13
RCLK1
output
14
ATTEN1, CS
input
15 - 17
RLOOP1, INT
bi-directional
18
RLOOP2, SCLK, RD(DS)
input
19 - 21
LLOOP, SDO, AD0
bi-directional
22 - 24
TAOS1, SDI, AD1
bi-directional
25 - 27
TAOS2, SPOL, AD2
bi-directional
28 - 30
CON01, AD3
bi-directional
31 - 33
CON02, AD4
bi-directional
34 - 36
CON11, AD5
bi-directional
37 - 39
CON12, AD6
bi-directional
40 - 42
CON21, AD7
bi-directional
43
CON22, ALE(AS)
input
44
CON31, WR(R/W)
input
45 - 46
RCLK2
output
47 - 48
RPOS2, RDATA2
output
49 - 50
RNEG2, BPV2
output
51
TCLK2
input
52
TPOS2, TDATA2
input
53 - 55
TNEG2, AIS2
bi-directional
56 - 58
LOS2, SAD7
bi-directional
59
CON32, BTS
input
60
PD2, SAD5
input
61
PD1, SAD4
input
Table 10. Boundary Scan Register
CS61584A
32
DS261F1
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