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参数资料
| 型号： | EVAL-AD7280AEDZ |
| 厂商： | Analog Devices Inc |
| 文件页数： | 14/48页 |
| 文件大小： | 0K |
| 描述： | BOARD EVAL FOR AD7280 |
| 标准包装： | 1 |
| 主要目的： | 电源管理，电池监控器 |
| 嵌入式： | 否 |
| 已用 IC / 零件： | * |
| 主要属性： | * |
| 次要属性： | SPI 接口 |
| 已供物品： | 板 |
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AD7280A
TERMINOLOGY
V HYS (ppm) = ?
? V REF ( 25 ° C) ? V REF ( T_HYS ) ?
? × 10 6
V REF ( 25 ° C)
?
?
Differential Nonlinearity (DNL)
DNL is the difference between the measured and the ideal
1 LSB change between any two adjacent codes in the ADC.
Integral Nonlinearity (INL)
INL is the maximum deviation from a straight line passing
through the endpoints of the ADC transfer function. The
endpoints of the transfer function are zero scale (a point 1 LSB
below the first code transition) and full scale (a point 1 LSB
above the last code transition).
Offset Error
Offset error applies to straight binary output coding. It is the
deviation of the first code transition (000 ... 000) to (000 ... 001)
from the ideal, that is, AGND + 1 LSB for AUX1 to AUX6 and
1 V + AGND + 1 LSB for VIN0 to VIN6.
Offset Error Match
Offset error match is the difference in zero code error across all
six channels.
Gain Error
Gain error applies to straight binary output coding. It is the
deviation of the last code transition (111 ... 110) to (111 ... 111)
from the ideal (that is, 2 × V REF ? 1 LSB) after adjusting for the
offset error.
Gain Error Match
Gain error match is the difference in gain error across all six
channels.
ADC Unadjusted Error
ADC unadjusted error includes the INL error and the offset and
gain errors of the ADC and measurement channel.
Output Voltage Hysteresis
Output voltage hysteresis, or thermal hysteresis, is defined as
the absolute maximum change of reference output voltage after
the device is cycled through temperature from either T_HYS+
or T_HYS?, where:
T_HYS+ = +25°C to T MAX to +25°C
T_HYS? = +25°C to T MIN to +25°C
Output voltage hysteresis is expressed in ppm using the follow-
ing equation:
? ?
where:
V REF (25°C) = V REF at 25°C.
V REF (T_HYS) is the maximum change of V REF at T_HYS+ or
T_HYS?.
Static Leakage Current
Static leakage current is the current measured on the cell voltage
and/or the auxiliary ADC inputs when the device is static, that
is, not converting.
Dynamic Leakage Current
Dynamic leakage current is the current measured on the cell
voltage and/or the auxiliary ADC inputs when the device is
converting, with the static leakage current subtracted. Dynamic
leakage current is specified with a convert start pulse frequency
of 10 Hz, that is, every 100 ms. The dynamic leakage current for
a different conversion rate can be calculated using the following
equation:
I DYN(B) = ?
?
?
?
Total Unadjusted Error (TUE)
TUE is the maximum deviation of the output code from the ideal.
Total unadjusted error includes the INL error, the offset and gain
? I DYN(A) × f CNVST ( B )
? f CNVST ( A )
?
?
errors, and the reference errors. Reference errors include the
difference between the actual and ideal reference voltage (that
is, 2.5 V) and the reference voltage temperature coefficient.
Reference Voltage Temperature Coefficient
The reference voltage temperature coefficient is derived from
where:
I DYN(A) is the dynamic leakage current at the convert start
frequency, f CNVST(A) (see Table 1).
I DYN(B) is the dynamic leakage current at the desired convert
start frequency, f CNVST(B) .
TCV REF (ppm/ ° C) = ?
? V REF ( Max ) ? V REF ( Min ) ?
? 2 . 5 V × ( T
? T MIN ) ? ?
the maximum and minimum reference output voltage (V REF )
measured between T MIN and T MAX . It is expressed in ppm/°C
using the following equation:
? × 10 6
? MAX
where:
V REF ( Max ) is the maximum V REF between T MIN and T MAX .
V REF ( Min ) is the minimum V REF between T MIN and T MAX .
T MAX = +85°C or +105°C.
T MIN = ?40°C.
Rev. 0 | Page 14 of 48
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| EVAL-AD7298SDZ | 制造商:Analog Devices 功能描述:EVAL BOARD, AD7192 12BIT ADC |
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