参数资料
型号: MAX9979EVKIT+
厂商: Maxim Integrated Products
文件页数: 22/60页
文件大小: 0K
描述: EVAL KIT MAX9979
标准包装: 1
系列: *
Dual 1.1Gbps Pin Electronics with Integrated
PMU and Level-Setting DACs
ELECTRICAL CHARACTERISTICS (continued)
(V CC = 9.75V, V EE = -4.75V, V DD = 3.3V, V HHP = 17.5V, V DHV_ = 3V, V DLV_ = 0V, V DTV_ = 1.5V, SC1 = SC0 = 0V, V CPHV_ = 7.2V,
V CPLV_ = -2.2V, V CTV_ = 1.4V, V BV_ = 4V, V DGS = V GND = 0V, V CHV_ = V IVMAX_ = 2V, V CLV_ = V IVMIN_ = 1V, V COM_ = 2.5V,
V LDHV_ = 0V, V LDLV_ = 0V, V IN_ = 2.5V, V VIOS = 0V, V IIOS = 2.5V, V CLAMPHI_ = 5V, V CLAMPLO_ = 0V, V HH_ = 10V, CDRP = 0b001, RO
= 0b1000, HYST = 0b000, Z LOAD = 50 Ω , T J = +70°C to an accuracy of ±15°C, unless otherwise noted. All temperature coefficients are
measured at T J = +40°C to +100°C, unless otherwise noted.) (Note 1)
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Unless otherwise specified, all minimum and maximum specifications are production tested. All other specification test
limits are guaranteed by design. All tests are performed at nominal supply voltages and after gain and offset calibration,
unless otherwise specified.
Guaranteed by the associated linearity test.
Change in offset at any voltage over the operating range. Specification includes both gain and offset temperature effects.
Limits have been simulated over the entire operating range and verified at worst-case conditions (V DHV_ - V DLV_ >
200mV).
Guaranteed by design and characterization.
V CC and VE E independently varied over their full range.
DATA_ = 1V, V DHV_ = 3V, V DLV_ = 0V, V DTV_ = 1.5V, I OUT = ±30mA. Different values within the range of 48 Ω to 52 Ω are
available by custom trimming (contact factory).
Resistance measurements are made using ±2.5mA current changes in the loading instrument about the noted value.
Absolute value of the difference in measured resistance at the specified points, tested separately for each current polarity.
Rise time, unless otherwise specified for the differential inputs DATA_ and RCV_, is 250ps (10% to 90%) at 40MHz. (These
conditions are for bench characterization. Final test conditions may differ from bench.)
±8V step into AC-coupled 10 Ω load. Current supplied for a minimum of 10ns. Guaranteed by design to be greater than or
equal to DC drive current.
V DTV_ = 1.5V, R S = 50 Ω . External signal driven into a transmission line to produce a 0 to 3V edge at the comparator input
with a 600ps rise time (10% to 90%). Measurement point is at the comparator input.
Measured between the 90% point of the driver output (relative to its final value) and the waveform settling to within the
specified limit.
Propagation delays are measured from the crossing point of the differential input signals to the 50% point of expected out-
put swing.
Average of two measurements for propagation-delay match, t LH vs. t HL .
Four measurements are made: DHV_ to high impedance, DLV_ to high impedance, high impedance to DHV_, and high
impedance to DLV_. The worst of the four measurements is reported.
Average of four measurements of propagation-delay match, drive to high impedance vs. high impedance to drive.
Measured from the crossing point of RCV/NRCV to the 50% point of the output waveform.
Average of four measurements for propagation-delay match, drive to term vs. term to drive. Measured from the crossing
point of RCV/NRCV to the 50% point of the output waveform.
Four measurements are made: DHV_ to DTV_, DLV_ to DTV_, DTV_ to DHV_, and DTV_ to DLV_. The worst-case differ-
ence is reported.
Propagation-delay change is reported with respect to a 5ns pulse width.
At this pulse width, the output reaches at least 95% of its nominal (DC) amplitude. The pulse width is measured at DATA_
and NDATA_.
Maximum data rate in transitions/second. A waveform that reaches at least 95% of its programmed amplitude may be gen-
erated at half of this frequency.
Maximum data rate in transitions/second. A waveform that reaches at least 90% of its programmed amplitude may be gen-
erated at half of this frequency.
The comparators tolerate the VHH produced by the driver; however, the specifications only apply to the -1.5V to +6.5V
input range.
This specification is implicitly tested, by meeting the high-impedance leakage specification.
Change in offset at any voltage over operating range. Includes both gain (CMRR) and offset temperature effects.
Change in offset voltage over the input range.
Relative to straight line between 0 and 3V.
Change in offset voltage with power supplies independently varied over their full range. Both high and low comparators
are tested.
All propagation delays measured from V DUT_ crossing calibrated CHV_/CLV_ threshold to crossing point of differential
outputs.
22
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