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参数资料
| 型号： | MC74AC00DT |
| 厂商： | ON SEMICONDUCTOR |
| 元件分类： | 门电路 |
| 英文描述： | AC SERIES, QUAD 2-INPUT NAND GATE, PDSO14 |
| 封装： | PLASTIC, TSSOP-14 |
| 文件页数： | 15/45页 |
| 文件大小： | 434K |
| 代理商： | MC74AC00DT |
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26
Enable and Disable Times
Figure 1–25 and 1–26 show that the disable times are
measured at the point where the output voltage has risen or
fallen by 10% from the voltage rail level (i.e., ground for
tPLZ or VCC for tPHZ). This change enhances the
repeatability of measurements, reduces test times, and gives
the system designer more realistic delay times to use in
calculating minimum cycle times. Since the high impedance
state rising or falling waveform is RC-controlled, the first
10% of change is more linear and is less susceptible to
external influences. More importantly, perhaps from the
system designer’s point of view, a change in voltage of 10%
is adequate to ensure that a device output has turned OFF.
Measuring to a larger change in voltage merely exaggerates
the apparent Disable time and thus penalizes system
performance since the designer must use the Enable and
Disable times to devise worst case timing signals to ensure
that the output of one device is disabled before that of
another device is enabled.
Propagation Delay, fmax, Set, Hold, and
Recovery Times
A 1 MHz square wave is recommended for most
propagation delay tests. The repetition rate must necessarily
be increased for testing fmax. A 50% duty cycle should
always be used when testing fmax. Two pulse generators are
usually required for testing such parameters as setup time
(ts), hold time (th), recovery time (tREC) shown in
Figure 1–27.
Electrostatic Discharge
Precautions should be taken to prevent damage to devices
by electrostatic discharge. Static charge tends to accumulate
on insulated surfaces such as synthetic fabrics or carpeting,
plastic sheets, trays, foam, tubes or bags, and on ungrounded
electrical tools or appliances. The problem is much worse in
a dry atmosphere. In general, it is recommended that
individuals take the precaution of touching a known ground
before handling devices. To effectively avoid electrostatic
damage to FACT devices, it is recommended that
individuals wear a grounded wrist strap when handling
devices. More often, handling equipment, which is not
properly grounded, causes damage to parts. Ensure that all
plastic parts of the tester, which are near the device, are
conductive and connected to ground.
DATA
IN
CONTROL (CLOCK)
INPUT
MR
OR
CLEAR
ts
Vmi
th
Vmi
trec
Vmi
Figure 1–25. Setup Time, Hold Time and Recovery
Time
OUTPUT
CONTROL
DATA
OUT
tPZH
Vmo
tPHZ
Vmi
VCC
90% VCC
Figure 1–26. 3-State Output High Enable
and Disable Times
OUTPUT
CONTROL
DATA
OUT
tPZL
Vmo
Vmi
tPLZ
10% VCC
GND
Figure 1–27. 3-State Output Low Enable
and Disable Times
*Vmi = 50% VCC for ‘AC devices; 1.5 V for ‘ACT devices
Vmo = 50% VCC for ‘AC/‘ACT devices
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相关代理商/技术参数 |
参数描述 |
|---|---|
| MC74AC00DTR2 | 功能描述:逻辑门 2-6V Quad 2-Input RoHS:否 制造商:Texas Instruments 产品:OR 逻辑系列:LVC 栅极数量:2 线路数量（输入/输出）:2 / 1 高电平输出电流:- 16 mA 低电平输出电流:16 mA 传播延迟时间:3.8 ns 电源电压-最大:5.5 V 电源电压-最小:1.65 V 最大工作温度:+ 125 C 安装风格:SMD/SMT 封装 / 箱体:DCU-8 封装:Reel |
| MC74AC00DTR2G | 功能描述:逻辑门 2-6V Quad 2-Input NAND RoHS:否 制造商:Texas Instruments 产品:OR 逻辑系列:LVC 栅极数量:2 线路数量（输入/输出）:2 / 1 高电平输出电流:- 16 mA 低电平输出电流:16 mA 传播延迟时间:3.8 ns 电源电压-最大:5.5 V 电源电压-最小:1.65 V 最大工作温度:+ 125 C 安装风格:SMD/SMT 封装 / 箱体:DCU-8 封装:Reel |
| MC74AC00M | 制造商:Rochester Electronics LLC 功能描述:- Bulk |
| MC74AC00MEL | 功能描述:逻辑门 2-6V Quad 2-Input RoHS:否 制造商:Texas Instruments 产品:OR 逻辑系列:LVC 栅极数量:2 线路数量（输入/输出）:2 / 1 高电平输出电流:- 16 mA 低电平输出电流:16 mA 传播延迟时间:3.8 ns 电源电压-最大:5.5 V 电源电压-最小:1.65 V 最大工作温度:+ 125 C 安装风格:SMD/SMT 封装 / 箱体:DCU-8 封装:Reel |
| MC74AC00MELG | 功能描述:逻辑门 2-6V Quad 2-Input NAND RoHS:否 制造商:Texas Instruments 产品:OR 逻辑系列:LVC 栅极数量:2 线路数量（输入/输出）:2 / 1 高电平输出电流:- 16 mA 低电平输出电流:16 mA 传播延迟时间:3.8 ns 电源电压-最大:5.5 V 电源电压-最小:1.65 V 最大工作温度:+ 125 C 安装风格:SMD/SMT 封装 / 箱体:DCU-8 封装:Reel |
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