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| 型号： | ADE7753ARSZ |
| 厂商： | Analog Devices Inc |
| 文件页数： | 48/60页 |
| 文件大小： | 0K |
| 描述： | IC ENERGY METERING 1PHASE 20SSOP |
| 标准包装： | 66 |
| 输入阻抗： | 390 千欧 |
| 测量误差： | 0.1% |
| 电压 - 高输入/输出： | 2.4V |
| 电压 - 低输入/输出： | 0.8V |
| 电流 - 电源： | 3mA |
| 电源电压： | 4.75 V ~ 5.25 V |
| 测量仪表类型： | 单相 |
| 工作温度： | -40°C ~ 85°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 20-SSOP（0.209"，5.30mm 宽） |
| 供应商设备封装： | 20-SSOP |
| 包装： | 管件 |
| 产品目录页面： | 797 (CN2011-ZH PDF) |
| 配用： | EVAL-ADE7753ZEB-ND - BOARD EVALUATION AD7753 |
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ADE7753
The impulse/LSB ratio used to convert the value in the
LVARENERGY register into a pulse output can be expressed in
terms of impulses/ VARh and VARh /LSB.
Table 11. Frequency Dependencies of the ADE7753
Parameters
Parameter CLKIN Dependency
imp/LSB = imp / VARh × VARh / LSB =
VARConstan t ( imp / VARh ) × V nominal × I b
VARCF IB ( expected ) =
3600 s/h
VARCF IB ( expected )
VARCF nominal
× sin( ? )
(73)
(74)
Nyquist Frequency for CH 1 and CH 2 ADCs
PHCAL Resolution (Seconds per LSB)
Active Energy Register Update Rate (Hz)
Waveform Sampling Rate (per Second)
WAVSEL 1,0 = 0 0
01
CLKIN/8
4/CLKIN
CLKIN/4
CLKIN/128
CLKIN/256
VARCF IB ( nominal ) =
LVARENERGY IB × PERIOD 50 Hz
Accumulati on time (s) × PERIOD
(75)
10
11
Maximum ZXTOUT Period
CLKIN/512
CLKIN/1024
524,288/CLKIN
where the accumulation time is calculated from Equation 37.
The line period can be determined from the PERIOD register
according to Equation 38. Then VAR can be determined from
the LVARENERGY register value:
LVARENERGY IB × VARh / LSB × PERIOD 50 Hz
VARh = (76)
PERIOD
SUSPENDING ADE7753 FUNCTIONALITY
The analog and the digital circuit can be suspended separately.
The analog portion of the ADE7753 can be suspended by setting
the ASUSPEND bit (Bit 4) of the mode register to logic high—
see the Mode Register (0x9) section. In suspend mode, all wave-
VAR =
LVARENERGY IB × VARh / LSB × 3600 s/h PERIOD 50 Hz
Accumulati on time (s) × PERIOD
(77)
form samples from the ADCs are set to 0. The digital circuitry
can be halted by stopping the CLKIN input and maintaining a
logic high or low on the CLKIN pin. The ADE7753 can be
reactivated by restoring the CLKIN input and setting the
The PERIOD 50 Hz / PERIOD factor in the preceding VAR equations
is the correction factor for the 1/f frequency attenuation of the
low-pass filter. The PERIOD 50 Hz term refers to the line period at
calibration and could represent a frequency other than 50 Hz.
CLKIN FREQUENCY
In this data sheet, the characteristics of the ADE7753 are shown
when CLKIN frequency is equal to 3.579545 MHz. However, the
ADE7753 is designed to have the same accuracy at any CLKIN
frequency within the specified range. If the CLKIN frequency is
not 3.579545 MHz, various timing and filter characteristics need
to be redefined with the new CLKIN frequency. For example,
the cutoff frequencies of all digital filters such as LPF1, LPF2, or
HPF1, shift in proportion to the change in CLKIN frequency
according to the following equation:
ASUSPEND bit to logic low.
CHECKSUM REGISTER
The ADE7753 has a checksum register (CHECKSUM[5:0]) to
ensure the data bits received in the last serial read operation are
not corrupted. The 6-bit checksum register is reset before the
first bit (MSB of the register to be read) is put on the DOUT
pin. During a serial read operation, when each data bit becomes
available on the rising edge of SCLK, the bit is added to the
checksum register. In the end of the serial read operation, the
content of the checksum register is equal to the sum of all ones
in the register previously read. Using the checksum register, the
user can determine if an error has occurred during the last read
operation. Note that a read to the checksum register also
generates a checksum of the checksum register itself.
New Frequency = Original Frequency ×
CLKIN Frequency
3 . 579545 MHz
(78)
DOUT
CONTENT OF REGISTER (n-bytes)
The change of CLKIN frequency does not affect the timing
+
+
CHECKSUM REGISTER ADDR: 0x3E
characteristics of the serial interface because the data transfer is
synchronized with serial clock signal (SCLK). But one needs to
observe the read/write timing of the serial data transfer—see
the ADE7753 timing characteristics in Table 2. Table 11 lists
various timing changes that are affected by CLKIN frequency.
Rev. C | Page 48 of 60
02875-0-077
Figure 88. Checksum Register for Serial Interface Read
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相关代理商/技术参数 |
参数描述 |
|---|---|
| ADE7753ARSZ | 制造商:Analog Devices 功能描述:ENERGY METERING IC |
| ADE7753ARSZ | 制造商:Analog Devices 功能描述:IC MULTIFUNCTION METER |
| ADE7753ARSZRL | 功能描述:IC ENERGY METERING 1PHASE 20SSOP RoHS:是 类别:集成电路 (IC) >> PMIC - 能量测量 系列:- 产品培训模块:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 标准包装:2,500 系列:* |
| ADE7753-ARSZRL | 制造商:Analog Devices 功能描述: |
| ADE7753XRS | 制造商:Analog Devices 功能描述: |
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