参数资料
| 型号： | DS2154LNA2+ |
| 厂商： | Maxim Integrated Products |
| 文件页数： | 120/124页 |
| 文件大小： | 0K |
| 描述： | IC TXRX E1 5V 100-LQFP |
| 产品培训模块： | Lead (SnPb) Finish for COTS Obsolescence Mitigation Program |
| 标准包装： | 90 |
| 类型： | 收发器 |
| 驱动器/接收器数： | 1/1 |
| 规程： | E1 |
| 电源电压： | 4.75 V ~ 5.25 V |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 100-LQFP |
| 供应商设备封装： | 100-LQFP（14x14） |
| 包装： | 托盘 |
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DS21354/DS21554 3.3V/5V E1 Single-Chip Transceivers
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16.1.
Instruction Register
The instruction register contains a shift register as well as a latched parallel output and is 3 bits in length.
When the TAP controller enters the Shift-IR state, the instruction shift register will be connected between
JTDI and JTDO. While in the Shift-IR state, a rising edge on JTCLK with JTMS LOW will shift the data
one stage towards the serial output at JTDO. A rising edge on JTCLK in the Exit1-IR state or the Exit2-
IR state with JTMS HIGH will move the controller to the Update-IR state. The falling edge of that same
JTCLK will latch the data in the instruction shift register to the instruction parallel output. Instructions
supported by the DS21354/DS21554 with their respective operational binary codes are shown in
Table 16-1. Instruction Codes for IEEE 1149.1 Architecture
INSTRUCTION
SELECTED REGISTER
INSTRUCTION CODES
SAMPLE/PRELOAD
Boundary Scan
010
BYPASS
Bypass
111
EXTEST
Boundary Scan
000
CLAMP
Bypass
011
HIGHZ
Bypass
100
IDCODE
Device Identification
001
SAMPLE/PRELOAD
This is a mandatory instruction for the IEEE 1149.1 specification. This instruction supports two
functions. The digital I/Os of the device can be sampled at the boundary scan register without interfering
with the normal operation of the device by using the Capture-DR state. SAMPLE/PRELOAD also allows
the device to shift data into the boundary scan register via JTDI using the Shift-DR state.
BYPASS
When the BYPASS instruction is latched into the parallel instruction register, JTDI connects to JTDO
through the one-bit bypass test register. This allows data to pass from JTDI to JTDO not affecting the
device’s normal operation.
EXTEST
This allows testing of all interconnections to the device. When the EXTEST instruction is latched in the
instruction register, the following actions occur. Once enabled via the Update-IR state, the parallel
outputs of all digital output pins will be driven. The boundary scan register will be connected between
JTDI and JTDO. The Capture-DR will sample all digital inputs into the boundary scan register.
CLAMP
All digital outputs of the device will output data from the boundary scan parallel output while connecting
the bypass register between JTDI and JTDO. The outputs will not change during the CLAMP instruction.
HIGHZ
All digital outputs of the device will be placed in a high impedance state. The BYPASS register will be
connected between JTDI and JTDO.
IDCODE
When the IDCODE instruction is latched into the parallel instruction register, the identification test
register is selected. The device identification code will be loaded into the identification register on the
相关PDF资料 |
PDF描述 |
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| DS2154L | IC TXRX E1 1CHIP 5V ENH 100-LQFP |
| DS2155LN | IC TXRX T1/E1/J1 1-CHIP 100-LQFP |
| DS2156LN+ | IC TXRX T1/E1/J1 1-CHIP 100-LQFP |
| DS2172T/T&R | IC TESTER BIT ERROR RATE 32-TQFP |
| DS2174QN+ | IC BERT ENHANCED 44-PLCC |
相关代理商/技术参数 |
参数描述 |
|---|---|
| DS2154LNA2+ | 功能描述:网络控制器与处理器 IC Enhanced E1 Transceiver RoHS:否 制造商:Micrel 产品:Controller Area Network (CAN) 收发器数量: 数据速率: 电源电流（最大值）:595 mA 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:PBGA-400 封装:Tray |
| DS2154LND2 | 功能描述:网络控制器与处理器 IC RoHS:否 制造商:Micrel 产品:Controller Area Network (CAN) 收发器数量: 数据速率: 电源电流（最大值）:595 mA 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:PBGA-400 封装:Tray |
| DS2154LND2+ | 制造商:Maxim Integrated Products 功能描述:ENHANCED E1 SCT LQFP REVD2 IND LF - Rail/Tube |
| DS2155 | 制造商:DALLAS 制造商全称:Dallas Semiconductor 功能描述:T1/E1/J1 Single-Chip Transceiver TDM/UTOPIA II Interface |
| DS2155_06 | 制造商:DALLAS 制造商全称:Dallas Semiconductor 功能描述:T1/E1/J1 Single-Chip Transceiver |
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