参数资料
型号: MC8640DHX1250HE
厂商: FREESCALE SEMICONDUCTOR INC
元件分类: 微控制器/微处理器
英文描述: 32-BIT, 1250 MHz, MICROPROCESSOR, CBGA1023
封装: 33 X 33 MM, CERAMIC, FCBGA-1023
文件页数: 116/130页
文件大小: 1495K
代理商: MC8640DHX1250HE
MPC8640 and MPC8640D Integrated Host Processor Hardware Specifications, Rev. 3
86
Freescale Semiconductor
Serial RapidIO
15.9
Measurement and Test Requirements
Since the LP-Serial electrical specification are guided by the XAUI electrical interface specified in clause
47 of IEEE 802.3ae-2002, the measurement and test requirements defined here are similarly guided by
clause 47. In addition, the CJPAT test pattern defined in Annex 48A of IEEE802.3ae-2002 is specified as
the test pattern for use in eye pattern and jitter measurements. Annex 48B of IEEE802.3ae-2002 is
recommended as a reference for additional information on jitter test methods.
15.9.1
Eye Template Measurements
For the purpose of eye template measurements, the effects of a single-pole high pass filter with a 3 dB point
at (Baud Frequency)
÷ 1667 is applied to the jitter. The data pattern for template measurements is the
continuous jitter test pattern (CJPAT) defined in Annex 48A of IEEE802.3ae. All lanes of the LP-Serial
link shall be active in both the transmit and receive directions, and opposite ends of the links shall use
asynchronous clocks. Four lane implementations shall use CJPAT as defined in Annex 48A. Single lane
implementations shall use the CJPAT sequence specified in Annex 48A for transmission on lane 0. The
amount of data represented in the eye shall be adequate to ensure that the bit error ratio is less than 10-12.
The eye pattern shall be measured with AC coupling and the compliance template centered at 0 V
differential. The left and right edges of the template shall be aligned with the mean zero crossing points of
the measured data eye. The load for this test shall be 100-
Ω resistive ± 5% differential to 2.5 GHz.
15.9.2
Jitter Test Measurements
For the purpose of jitter measurement, the effects of a single-pole high pass filter with a 3 dB point at (Baud
Frequency)
÷ 1667 is applied to the jitter. The data pattern for jitter measurements is the continuous jitter
test pattern (CJPAT) pattern defined in Annex 48A of IEEE802.3ae. All lanes of the LP-Serial link shall
be active in both the transmit and receive directions, and opposite ends of the links shall use asynchronous
clocks. Four lane implementations shall use CJPAT as defined in Annex 48A. Single lane implementations
shall use the CJPAT sequence specified in Annex 48A for transmission on lane 0. Jitter shall be measured
with AC coupling and at 0 V differential. Jitter measurement for the transmitter (or for calibration of a jitter
tolerance setup) shall be performed with a test procedure resulting in a BER curve such as that described
in Annex 48B of IEEE802.3ae.
15.9.3
Transmit Jitter
Transmit jitter is measured at the driver output when terminated into a load of 100-
Ω resistive ± 5%
differential to 2.5 GHz.
15.9.4
Jitter Tolerance
Jitter tolerance is measured at the receiver using a jitter tolerance test signal. This signal is obtained by first
producing the sum of deterministic and random jitter defined in Section 15.7, “Receiver Specifications,
and then adjusting the signal amplitude until the data eye contacts the six points of the minimum eye
opening of the receive template shown in Figure 56 and Table 62. Note that for this to occur, the test signal
must have vertical waveform symmetry about the average value and have horizontal symmetry (including
jitter) about the mean zero crossing. Eye template measurement requirements are as defined above.
相关PDF资料
PDF描述
MC8640DHX1067NC 32-BIT, 1067 MHz, MICROPROCESSOR, CBGA1023
MC8640DTVU1000HE 32-BIT, 1000 MHz, MICROPROCESSOR, CBGA1023
MC8640DTHX1067NC 32-BIT, 1067 MHz, MICROPROCESSOR, CBGA1023
MC8640THX1250HC 32-BIT, 1250 MHz, MICROPROCESSOR, CBGA1023
MC8640DTVU1250HE 32-BIT, 1250 MHz, MICROPROCESSOR, CBGA1023
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