参数资料
型号: RM48L950PGET
厂商: TEXAS INSTRUMENTS INC
元件分类: 微控制器/微处理器
英文描述: 32-BIT, FLASH, 200 MHz, RISC MICROCONTROLLER, PQFP144
封装: GREEN, PLASTIC, LQFP-144
文件页数: 119/154页
文件大小: 2807K
代理商: RM48L950PGET
PRODUCTPREVIEW
f[MHz]
1.375
4.875
22
78
guaranteed fail
lower
threshold
guaranteed pass
upper
threshold
guaranteed fail
SPNS174
– SEPTEMBER 2011
4.7
Clock Monitoring
The LPO Clock Detect (LPOCLKDET) module consists of a clock monitor (CLKDET) and an internal low
power oscillator (LPO).
The LPO provides two different clock sources
– a low frequency (CLK80K) and a high frequency
(CLK10M).
The CLKDET is a supervisor circuit for an externally supplied clock signal (OSCIN). In case the OSCIN
frequency falls out of a frequency window, the CLKDET flags this condition in the global status register
(GLBSTAT bit 0: OSC FAIL) and switches all clock domains sourced by OSCIN to the CLK10M clock (limp
mode clock).
The valid OSCIN frequency range is defined as: fCLK10M / 4 < fOSCIN < fCLK10M * 4.
4.7.1
Clock Monitor Timings
Table 4-15. LPO and Clock Detection
Parameter
MIN
Type
MAX
Unit
Clock Detection
oscillator fail frequency - lower threshold, using
1.375
2.4
4.875
MHz
untrimmed LPO output
oscillator fail frequency - higher threshold, using
22
38.4
78
MHz
untrimmed LPO output
LPO - HF oscillator
untrimmed frequency
5.5
9.6
19.5
MHz
startup time from STANDBY (LPO BIAS_EN High for
10
s
at least 900ms)
cold startup time
900
s
ICC, CLK10M and CLK80K active
150
A
LPO - LF oscillator
untrimmed frequency
36
85
180
kHz
startup time from STANDBY (LPO BIAS_EN High for
100
s
at least 900ms)
cold startup time
2000
s
ICC, only CLK80K active
27
A
LPO
total ICC STANDBY current
20
A
Figure 4-8. LPO and Clock Detection, Untrimmed CLK10M
4.7.2
External Clock (ECLK) Output Functionality
The ECLK pin can be configured to output a pre-scaled clock signal indicative of an internal device clock.
This output can be externally monitored as a safety diagnostic.
4.7.3
Dual Clock Comparators
The Dual Clock Comparator (DCC) module determines the accuracy of selectable clock sources by
counting the pulses of two independent clock sources (counter 0 and counter 1). If one clock is out of
spec, an error signal is generated. For example, the DCC1 can be configured to use CLK10M as the
reference clock (for counter 0) and VCLK as the "clock under test" (for counter 1). This configuration
allows the DCC1 to monitor the PLL output clock when VCLK is using the PLL output as its source.
Copyright
2011, Texas Instruments Incorporated
System Information and Electrical Specifications
67
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