QPRO XQ4000E/EX QML High-Reliability FPGAs
2-44
DS021 (v2.2) June 25, 2000
1-800-255-7778
Product Specification
R
XQ4000E Switching Characteristics
XQ4000E Absolute Maximum Ratings(1)
Table 1: XQ4000E/EX Field Programmable Gate Arrays
Device
Max.
Logic
Gates
(No RAM)
Max.
RAM Bits
(No
Logic)
Typical
Gate Range
(Logic and
RAM)(1)
CLB
Matrix
Total
CLBs
Number
of
Flip-Flops
Max.
Decode
Inputs
per Side
Max.
User
I/O
Packages
XQ4005E
5,000
6,272
3,000 - 9,000
14 x 14
196
616
42
112
PG156,
CB164
XQ4010E
10,000
12,800
7,000 - 20,000
20 x 20
400
1,120
60
160
PG191,
CB196,
HQ208
XQ4013E
13,000
18,432
10,000 - 30,000
24 x 24
576
1,536
72
192
PG223,
CB228,
HQ240
XQ4025E
25,000
32,768
15,000 - 45,000
32 x 32
1,024
2,560
96
256
PG299,
CB228
XQ4028EX
28,000
32,768
18,000 - 50,000
32 x 32
1,024
2,560
96
256
PG299,
CB228,
HQ240,
BG352
Notes:
1.
Max values of Typical Gate Range include 20-30% of CLBs used as RAM.
Symbol
Description
Units
VCC
Supply voltage relative to GND
–0.5 to +7.0
V
VIN
Input voltage relative to GND(2)
–0.5 to VCC + 0.5
V
VTS
Voltage applied to High-Z output(2)
–0.5 to VCC + 0.5
V
TSTG
Storage temperature (ambient)
–65 to +150
°C
TSOL
Maximum soldering temperature (10s @ 1/16 in. = 1.5 mm)
+260
°C
TJ
Junction temperature
Ceramic package
+150
°C
Plastic package
+125
°C
Notes:
1.
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress
ratings only, and functional operation of the device at these or any other conditions beyond those listed under Operating Conditions
is not implied. Exposure to Absolute Maximum Ratings conditions for extended periods of time may affect device reliability.
2.
Maximum DC excursion above VCC or below Ground must be limited to either 0.5V or 10 mA, whichever is easier to achieve. During
transitions, the device pins may undershoot to –2.0V or overshoot to VCC + 2.0V, provided this over or undershoot lasts less than
10 ns and with the forcing current being limited to 200 mA.