参数资料
型号: EVAL-ADUC7039QSPZ
厂商: Analog Devices Inc
文件页数: 15/92页
文件大小: 0K
描述: BOARD EVAL FOR ADUC7039
设计资源: ADuC7039QSPZ Gerber Files
EVAL-ADuC7039 Schematic & Brd Outline
标准包装: 1
系列: QuickStart™ PLUS 套件
类型: MCU
适用于相关产品: ADuC7039
所含物品:
ADuC7039
Data Sheet
Rev. D | Page 22 of 92
FLASH/EE MEMORY SECURITY
The 62 kB of Flash/EE memory available to the user can be
read- and write-protected using the FEEHID register.
The MSB of FEEHID (Bit 31) protects the entire Flash/EE from
being read through JTAG.
Bits[30:0] of FEEHID protect Page 123 to Page 0 from writing.
Each bit protects four pages, that is, 2 kB.
The FEEPRO register mirrors the bit definitions of the FEEHID
MMR. The FEEPRO MMR allows user code to lock the pro-
tection or security configuration of the Flash/EE memory so
that the protection configuration is automatically loaded on
subsequent power-on or reset events. This flexibility allows
the user to temporarily set and test protection settings using
the FEEHID MMR and, subsequently, lock the required
protection configuration (using FEEPRO) when shipping
protection systems into the field.
Flash/EE Memory Protection Registers
Name:
FEEHID and FEEPRO
Address:
0xFFFF0E20 (for FEEHID) and 0xFFFF0E1C (for FEEPRO)
Default Value:
0xFFFFFFFF (for FEEHID) and 0x00000000 (for FEEPRO)
Access:
Read/write
Function:
These registers are written by user code to configure the protection of the Flash/EE memory.
Table 13. FEEHID and FEEPRO MMR Bit Designations
Bit
Description
31
Read protection.
This bit is cleared by user code to read protect the 62 kB Flash/EE block code.
This bit is set by user code to allow read access to the 62 kB Flash/EE block via JTAG.
30 to 0
Write protection bits.
When set by user code, these bits unprotect Page 0 to Page 123 of the 62 kB Flash/EE code memory. Each bit write
protects four pages, and each page consists of 512 bytes.
When cleared by user code, these bits write protect Page 0 to Page 123 of the 62 kB Flash/EE code memory. Each bit
write protects four pages, and each page consists of 512 bytes.
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