
PM7346 S/UNI-QJET
DATASHEET
PMC-960835
ISSUE 6
SATURN QUAD USER NETWORK INTERFACE FOR J2, E3, T3
PMC-SIERRA, INC. PROPRIETARY AND CONFIDENTIAL TO PMC-SIERRA INC., AND ITS CUSTOMERS’ INTERNAL USE
286
11
TEST FEATURES DESCRIPTION
Simultaneously asserting (low) the CSB, RDB and WRB inputs causes all digital
output pins and the data bus to be held in a high-impedance state. This test
feature may be used for board testing.
Test mode registers are used to apply test vectors during production testing of
the S/UNI-QJET. Test mode registers (as opposed to normal mode registers) are
selected when A[10] is high.
Test mode registers may also be used for board testing. When all of the TSBs
within the S/UNI-QJET are placed in test mode 0, device inputs may be read and
device outputs may be forced via the microprocessor interface (refer to the
section "Test Mode 0" for details).
In addition, the S/UNI-QJET also supports a standard IEEE 1149.1 five-signal
JTAG boundary scan test port for use in board testing. All digital device inputs
may be read and all digital device outputs may be forced via the JTAG test port.
Table 23
- Test Mode Register Memory Map
Address
Register
000H-3FFH
Normal Mode Registers
400H
Master Test Register
408H
508H
608H
708H
SPLR Test Register 0
409H
509H
609H
709H
SPLR Test Register 1
40AH
50AH
60AH
70AH
SPLR Test Register 2
40BH
50BH
60BH
70BH
Reserved
40CH
50CH
60CH
70CH
SPLT Test Register 0
40DH
50DH
60DH
70DH
SPLT Test Register 1
40EH
50EH
60EH
70EH
SPLT Test Register 2
40FH
50FH
60FH
70FH
SPLT Test Register 3
410H
510H
610H
710H
PMON Test Register 0
411H
511H
611H
711H
PMON Test Register 1
412H-
41FH
512H-
51FH
612H-
61FH
712H-
71FH
Reserved