Obsolete
Product(s)
- Obsolete
Product(s)
ST72324B-Auto
Electrical characteristics
12.8.2
Electromagnetic interference (EMI)
Based on a simple application running on the product (toggling two LEDs through the I/O
ports), the product is monitored in terms of emission. This emission test is in line with the
norm SAE J 1752/3 which specifies the board and the loading of each pin.
Table 101.
EMS test results
Symbol
Parameter
Conditions
Level/class
VFESD
Voltage limits to be applied on any I/O pin to
induce a functional disturbance
32 Kbyte Flash or ROM device:
VDD = 5V, TA = +25°C, fOSC = 8MHz
conforms to IEC 1000-4-2
3B
8 or 16 Kbyte ROM device:
VDD = 5V, TA = +25°C, fOSC = 8MHz
conforms to IEC 1000-4-2
4A
8 or 16 Kbyte Flash device:
VDD = 5V, TA = +25°C, fOSC = 8MHz
conforms to IEC 1000-4-2
4B
VFFTB
Fast transient voltage burst limits to be
applied through 100pF on VDD and VDD pins
to induce a functional disturbance
VDD = 5V, TA = +25°C, fOSC = 8MHz
conforms to IEC 1000-4-4
4A
Table 102.
EMI emissions
Symbol
Parameter
Conditions
Device/package(1)
Monitored
frequency band
Max vs [fOSC/fCPU]
Unit
8/4 MHz
16/8 MHz
SEMI
Peak level(2)
VDD = 5V
TA = +25°C
conforming to
SAE J 1752/3
8/16 Kbyte Flash
LQFP32 and LQFP44
0.1 MHz to 30 MHz
12
18
dBV
30 MHz to 130 MHz
19
25
130 MHz to 1 GHz
15
22
SAE EMI Level
3
3.5
-
32 Kbyte Flash
LQFP32 and LQFP44
0.1 MHz to 30 MHz
13
14
dBV
30 MHz to 130 MHz
20
25
130 MHz to 1 GHz
16
21
SAE EMI Level
3.0
3.5
-
8/16 Kbyte ROM
LQFP32 and LQFP44
0.1 MHz to 30 MHz
12
15
dBV
30 MHz to 130 MHz
23
26
130 MHz to 1 GHz
15
20
SAE EMI Level
3.0
3.5
-
32 Kbyte ROM
LQFP32 and LQFP44
0.1 MHz to 30 MHz
17
21
dBV
30 MHz to 130 MHz
24
30
130 MHz to 1 GHz
18
23
SAE EMI Level
3.0
3.5
-
1.
Refer to application note AN1709 for data on other package types.
2.
Not tested in production.