参数资料
型号: TC58NS256DC
厂商: Toshiba Corporation
英文描述: TENTATIVE TOSHIBA MOS DIGITAL INTEGRATED CIRCUIT SILICON GATE CMOS 256-MBIT (32M ?8 BITS) CMOS NAND E2PROM (32M BYTE SmartMediaTM)
中文描述: 马鞍山暂定东芝数字集成电路硅栅CMOS 256兆位(32M的?8位)的CMOS NAND型E2PROM的(32兆字节SmartMediaTM)
文件页数: 4/33页
文件大小: 709K
代理商: TC58NS256DC
TC58NS256DC
2000-08-27 4/33
AC CHARACTERISTICS AND OPERATING CONDITIONS
(Ta
=
0°~55°C, V
CC
=
3.3 V
±
0.3 V)
SYMBOL
PARAMETER
MIN
MAX
UNIT
NOTES
t
CLS
CLE Setup Time
0
ns
t
CLH
CLE Hold Time
10
ns
t
CS
CE Setup Time
0
ns
t
CH
CE Hold Time
10
ns
t
WP
Write Pulse Width
25
ns
t
ALS
ALE Setup Time
0
ns
t
ALH
ALE Hold Time
10
ns
t
DS
Data Setup Time
20
ns
t
DH
Data Hold Time
10
ns
t
WC
Write Cycle Time
50
ns
t
WH
WE
-High Hold Time
15
ns
t
WW
WP
High to
WE
Low
100
ns
t
RR
Ready-to-
RE
Falling Edge
20
ns
t
RP
Read Pulse Width
35
ns
t
RC
Read Cycle Time
50
ns
t
REA
RE
Access Time (Serial Data Access)
35
ns
t
CEH
CE -High Time for Last Address in Serial Read Cycle
100
ns
(2)
t
REAID
RE
Access Time (ID Read)
35
ns
t
OH
Data Output Hold Time
10
ns
t
RHZ
RE
-High-to-Output-High Impedance
30
ns
t
CHZ
CE -High-to-Output-High Impedance
20
ns
t
REH
RE
-High Hold Time
15
ns
t
IR
Output-High-Impedance-to-
RE
Rising Edge
0
ns
t
RSTO
RE
Access Time (Status Read)
35
ns
t
CSTO
CE Access Time (Status Read)
45
ns
t
RHW
RE
High to
WE
Low
0
ns
t
WHC
WE
High to CE Low
30
ns
t
WHR
WE
High to
RE
Low
30
ns
t
AR1
ALE Low to
RE
Low (ID Read)
100
ns
t
CR
CE Low to
RE
Low (ID Read)
100
ns
t
R
Memory Cell Array to Starting Address
25
μ
s
t
WB
WE
High to Busy
200
ns
t
AR2
ALE Low to
RE
Low (Read Cycle)
50
ns
t
RB
RE
Last Clock Rising Edge to Busy (in Sequential Read)
200
ns
t
CRY
CE High to Ready (When interrupted by CE in Read Mode)
600
+
t
r
BY
/
RY
(
)
ns
(1)
t
RST
Device Reset Time (Read/Program/Erase)
6/10/500
μ
s
AC TEST CONDITIONS
PARAMETER
VALUES
Input level
2.4 V, 0.4 V
Input pulse rise and fall time
3 ns
Input comparison level
1.5 V, 1.5 V
Output data comparison level
1.5 V, 1.5 V
Output load
C
L
(100 pF)
+
1 TTL
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