参数资料
型号: DAC5688IRGCTG4
厂商: TEXAS INSTRUMENTS INC
元件分类: DAC
英文描述: PARALLEL, WORD INPUT LOADING, 0.0104 us SETTLING TIME, 16-BIT DAC, PQCC64
封装: 9 X 9 MM, GREEN, PLASTIC, VQFN-64
文件页数: 6/56页
文件大小: 1321K
代理商: DAC5688IRGCTG4
SLLS880C – DECEMBER 2007 – REVISED AUGUST 2010
www.ti.com
TEST METHODOLOGY
Typical AC specifications were characterized with the DAC5688EVM. A sinusoidal master clock frequency is
generated by an HP8665B signal generator which drives an Agilent 8133A pulse generator to generate a square
wave output clock for the TSW3100 Pattern Generator and EVM input clock. On the EVM, the input clock is
driven by an CDCM7005 clock distribution chip that is configured to simply buffer the external clock or divide it
down for necessary test configurations.
The DAC5688 output is characterized with a Rohde and Schwarz FSU spectrum analyzer. For WCDMA signal
characterization, it is important to use a spectrum analyzer with high IP3 and noise subtraction capability so that
the spectrum analyzer does not limit the ACPR measurement.
DEFINITION OF SPECIFICATIONS
Adjacent Carrier Leakage Ratio (ACLR): Defined for a 3.84Mcps 3GPP W-CDMA input signal measured in a
3.84MHz bandwidth at a 5MHz offset from the carrier with a 12dB peak-to-average ratio.
Analog and Digital Power Supply Rejection Ratio (APSRR, DPSRR): Defined as the percentage error in the
ratio of the delta IOUT and delta supply voltage normalized with respect to the ideal IOUT current.
Differential Nonlinearity (DNL): Defined as the variation in analog output associated with an ideal 1 LSB
change in the digital input code.
Gain Drift: Defined as the maximum change in gain, in terms of ppm of full-scale range (FSR) per °C, from the
value at ambient (25°C) to values over the full operating temperature range.
Gain Error: Defined as the percentage error (in FSR%) for the ratio between the measured full-scale output
current and the ideal full-scale output current.
Integral Nonlinearity (INL): Defined as the maximum deviation of the actual analog output from the ideal output,
determined by a straight line drawn from zero scale to full scale.
Intermodulation Distortion (IMD3, IMD): The two-tone IMD3 or four-tone IMD is defined as the ratio (in dBc) of
the worst 3rd-order (or higher) intermodulation distortion product to either fundamental output tone.
Offset Drift: Defined as the maximum change in DC offset, in terms of ppm of full-scale range (FSR) per °C,
from the value at ambient (25°C) to values over the full operating temperature range.
Offset Error: Defined as the percentage error (in FSR%) for the ratio between the measured mid-scale output
current and the ideal mid-scale output current.
Output Compliance Range: Defined as the minimum and maximum allowable voltage at the output of the
current-output DAC. Exceeding this limit may result reduced reliability of the device or adversely affecting
distortion performance.
Reference Voltage Drift: Defined as the maximum change of the reference voltage in ppm per degree Celsius
from value at ambient (25°C) to values over the full operating temperature range.
Spurious Free Dynamic Range (SFDR): Defined as the difference (in dBc) between the peak amplitude of the
output signal and the peak spurious signal.
Signal to Noise Ratio (SNR): Defined as the ratio of the RMS value of the fundamental output signal to the
RMS sum of all other spectral components below the Nyquist frequency, including noise, but excluding the first
six harmonics and dc.
14
Copyright 2007–2010, Texas Instruments Incorporated
Product Folder Link(s): DAC5688
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