参数资料
型号: ADUC7032BSTZ-8V-RL
厂商: Analog Devices Inc
文件页数: 29/128页
文件大小: 0K
描述: IC BATTERY SENSOR PREC 48-LQFP
标准包装: 1
系列: MicroConverter® ADuC7xxx
核心处理器: ARM7
芯体尺寸: 16/32-位
速度: 20.48MHz
连通性: LIN,SPI,UART/USART
外围设备: POR,PSM,温度传感器,WDT
输入/输出数: 9
程序存储器容量: 96KB(48K x 16)
程序存储器类型: 闪存
RAM 容量: 1.5K x 32
电压 - 电源 (Vcc/Vdd): 3.5 V ~ 18 V
数据转换器: A/D 2x16b
振荡器型: 内部
工作温度: -40°C ~ 105°C
封装/外壳: 48-LQFP
包装: 标准包装
其它名称: ADUC7032BSTZ-8V-RLDKR
Preliminary Technical Data
ADuC7032
Rev. PrD | Page 124 of 128
ADUC7032 ON-CHIP DIAGNOSTICS
The ADuC7032 integrates multiple diagnostic support circuits on-chip. These circuits allow the device to test core digital functionality,
analog front-end and high-voltage I/O ports in-circuit.
ADC Diagnostics
Internal Test Voltage
The current channel can be configured to convert on an internal 8.3mV test voltage . On any gain range the result should be within
±0.5% of the expected result.
Internal Short Mode
The current and voltage input channels can also be shorted internally. Converting on the internal short will allow an assessment of the
internal ADC noise to be determined.
Internal Current Sources
Internal current sources can also be enabled on both current and temperature channels. These current sources can be used to determine
external short or open circuit conditions in both external shunt or temperature sensor configurations.
High Voltage I/O Diagnostics
High Voltage I/O Read back
All high voltage I/O pins are supported with read back capability. This allows the detection of external short conditions.
High Voltage Current Detection
All high voltage I/O pins also have a high current detection capability allowing high side connections to VBAT to be detected and
controlled.
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