参数资料
型号: ADUC7032BSTZ-8V-RL
厂商: Analog Devices Inc
文件页数: 8/128页
文件大小: 0K
描述: IC BATTERY SENSOR PREC 48-LQFP
标准包装: 1
系列: MicroConverter® ADuC7xxx
核心处理器: ARM7
芯体尺寸: 16/32-位
速度: 20.48MHz
连通性: LIN,SPI,UART/USART
外围设备: POR,PSM,温度传感器,WDT
输入/输出数: 9
程序存储器容量: 96KB(48K x 16)
程序存储器类型: 闪存
RAM 容量: 1.5K x 32
电压 - 电源 (Vcc/Vdd): 3.5 V ~ 18 V
数据转换器: A/D 2x16b
振荡器型: 内部
工作温度: -40°C ~ 105°C
封装/外壳: 48-LQFP
包装: 标准包装
其它名称: ADUC7032BSTZ-8V-RLDKR
Preliminary Technical Data
ADuC7032
Rev. PrD | Page 105 of 128
HANDLING INTERRUPTS FROM THE HIGH VOLTAGE PERIPHERAL CONTROL INTERFACE
An interrupt controller is also integrated with the high voltage
circuits. If enabled via IRQEN[16], one of 5 high voltage
sources can assert the high voltage interrupt (IRQ3) signal and
interrupt the MCU core.
While the MCU response to this interrupt event is, as normal,
to vector to the IRQ or FIQ interrupt vector address. The high
voltage interrupt controller simultaneously and automatically
loads the current value of the high voltage Status register
(HVSTA) into the HVDAT register. During this time the BUSY
bit in HVCON[0] is set to indicate the transfer is in progress
and will be cleared after 10usecs to indicate the HVSTA
contents are now available in HVDAT.
The interrupt handler can therefore poll the busy bit in
HVCON until it de-asserts and then read the HVDAT register
At this time HVDAT will then hold the value of the HVSTA
register. The status flags can then be interrogated to determine
the exact source of the high voltage interrupt and the
appropriate action taken.
LOW VOLTAGE FLAG ( LVF )
The ADuC7032 features a Low Voltage flag, which when
enabled allows the user to monitor REG_DVDD. When enabled
via HVCFG0[2], the Low Voltage Flag may be monitored via
HVMON[3]. If REG_DVDD drops below 2.1V, then
HVMON[3] is cleared. If REG_DVDD drops below 2.1V the
Ram contents are corrupted. Once the Low Voltage Flag is
enabled, it is only reset by REG_DVDD dropping below 2.1V
or the disabling of the LVF functionality via HVCFG0[2].
HIGH VOLTAGE DIAGNOSTICS
It is possible to diagnosis fault conditions on the Wake and LIN bus as follows.
Table 68: High Voltage Diagnostics
High Voltage Pin
Fault Condition
Method
Result
Short Between LIN
and VBat
Drive LIN Low
LIN Short Circuit interrupt will be generated after 20uS if
more than 100mA is drawn continuously.
LIN
Short Between LIN
and GND
Drive LIN High
LIN Read back reads back low.
Short Between Wake
and VBat
Drive Wake Low
Read Back high
Short Between Wake
and GND
Drive Wake High
Wake Short Circuit interrupt will be generated
after 400us if more than 200mA is sourced
Wake
Open Circuit
Enable OC Diagnostic
Resistor with Wake disabled.
HVMON[7] will be cleared if load is connected
and set if wake is open circuited
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