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参数资料
| 型号： | NOIH2SM1000S-HHC |
| 厂商： | ON Semiconductor |
| 文件页数： | 4/67页 |
| 文件大小： | 0K |
| 描述： | IC SPACE IMAGE SENSOR 84-JLCC |
| 标准包装： | 1 |
| 系列： | HAS2 |
| 象素大小： | 18µm x 18µm |
| 有源象素阵列： | 1024H x 1024V |
| 电源电压： | 3.3V |
| 类型： | CMOS 成像 |
| 封装/外壳： | * |
| 供应商设备封装： | * |
| 包装： | * |
| 其它名称： | CYIH1SM1000AA-HHCS CYIH1SM1000AA-HHCS-ND |
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NOIH2SM1000A
Data Pack
Each set of devices will have a data pack which will be
made available to the customer. The data pack consists of:
? CoC form referring to the applicable specification
? Calibration data
? Screening Report
? Life Test Report and Radiation (Total Dose) Test
Report for each wafer lot
? Electrical Test Report
? Spectral response data
? Visual Inspection Report
? DPA Test Report
Marking
General
The marking must consist of lead identification and
traceability information.
Lead Identification
An index to pin 1 must be located on the top of the package
in the position defined in Figure 4 on page 25. The pin
numbering is counter clock-wise, when looking at the
top-side of the component.
Traceability Information
Each component must be marked such that complete
traceability is maintained.
The component must have a number as follows:
11
12
32
33
XXXXX = Specific Device Code
A = Assembly Location
WL = Wafer Lot
1
84
75
74
54
53
YY = Year
WW = Work Week
NNNN = Serial Number
Figure 1. Product Marking
Table 5. PACKAGE MARK DECODER
Orderable Part Number
NOIH2SM1000T-HHC
NOIH2SM1000A-HHC
NOIH2SM1000S-HHC
NOIH2SM1000A-HWC
NOIH2SM1000S-HWC
Package Mark: Line 1
NOIH2SM1000T
NOIH2SM1000A
NOIH2SM1000S
NOIH2SM1000A
NOIH2SM1000S
Package Mark: Line 2
-HHC NNNN
-HHC NNNN
-HHC NNNN
-HWC NNNN
-HWC NNNN
Package Mark: Line 3
AWLYYWW
AWLYYWW
AWLYYWW
AWLYYWW
AWLYYWW
where NNNN- serialized number controlled manually by ON Semiconductor, BELGIUM
where DD-MM-YYYY represents the lot assembly date
NOIH2SM1000T-HHC has a Minimum Order Quantity of 10
Electrical and Electro ? optical Measurements
Electrical and Electro ? optical Measurements at Reference
Temperature
The parameters to be measured to verify the electrical and
electro-optical specifications are given in Table 18 on
page 14 and Table 27 on page 24. Unless otherwise
specified, the measurements must be performed at a
environmental temperature of 22 ± 3 ° C.
For all measurements, the nominal power supply, bias,
and clocking conditions apply. The nominal power supply
and bias conditions are given in Table 28 on page 24; the
timing diagrams in Figure 35 on page 47 and Figure 37 on
page 49.
NOTE: The given bias and power supply settings imply
that the devices are measured in ‘soft-reset’
condition.
Electrical and Electro ? optical Measurements at High and
Low Temperature
Table 19 on page 15 and Table 20 on page 16 list the
parameters to be measured to verify electrical and
electro-optical specifications. Unless otherwise specified,
http://onsemi.com
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