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| 型号： | NOIH2SM1000S-HHC |
| 厂商： | ON Semiconductor |
| 文件页数： | 5/67页 |
| 文件大小： | 0K |
| 描述： | IC SPACE IMAGE SENSOR 84-JLCC |
| 标准包装： | 1 |
| 系列： | HAS2 |
| 象素大小： | 18µm x 18µm |
| 有源象素阵列： | 1024H x 1024V |
| 电源电压： | 3.3V |
| 类型： | CMOS 成像 |
| 封装/外壳： | * |
| 供应商设备封装： | * |
| 包装： | * |
| 其它名称： | CYIH1SM1000AA-HHCS CYIH1SM1000AA-HHCS-ND |
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NOIH2SM1000A
the measurements must be performed at –40 (–5 +0) ° C and
at +85 (+5 –0) ° C.
Circuits for Electrical and Electro ? optical Measurements
Circuits for performing the electro ? optical tests in
Table 18 on page 14 and Table 27 on page 24 are shown in
Figure 49 on page 59 to Figure 52 on page 59.
Burn ? in Test
Parameter Drift Values
The parameter drift values for power burn-in are specified
in Table 21 on page 18. Unless otherwise specified, the
measurements must be conducted at an environmental
temperature of 22 ± 3 ° C and under nominal power supply,
bias, and timing conditions.
Do not exceed the parameter drift values. In addition to
these drift value requirements, do not exceed the limit values
of any parameter, as indicated in Table 18 on page 14
Conditions for High Temperature Reverse Bias Burn-in
Not Applicable
Conditions for Power Burn-in
The conditions for power burn-in is specified in Table 24
on page 20 of this specification.
Electrical Circuits for High Temperature Reverse Bias
Burn-in
Not Applicable
Electrical Circuits for Power Burn-in
Circuits to perform the power burn-in test are shown in
Figure 48 on page 58 and Figure 49 on page 59 of this
specification.
Environmental and Endurance Tests
Electrical and Electro-optical Measurements on
Completion of Environmental Test
The parameters to be measured on completion of
environmental tests are listed in Table 25 on page 21. Unless
otherwise stated, the measurements must be performed at a
environmental temperature of 22 ± 3 ° C. Measurements of
dark current must be performed at 22 ± 1 ° C and the actual
environmental temperature must be reported with the test
results.
Electrical and Electro-optical Measurements At
Intermediate Point During Endurance Test
The parameters to be measured at intermediate points
during endurance test of environmental tests are listed in
Table 25 on page 21. Unless otherwise stated, the
measurements must be performed at an environmental
temperature of 22 ± 3 ° C.
Electrical and electro-optical Measurements on Completion
of Endurance Test
The parameters to be measured on completion of
endurance tests are listed in Table 25 on page 21. Unless
otherwise stated, the measurements must be performed at a
environmental temperature of 22 ± 3 ° C.
Conditions for Operating Life Test
The conditions for operating life tests must be as specified
in Table 24 on page 20 of this specification.
Electrical Circuits for Operating Life Test
Circuits for performing the operating life test are shown
in Figure 49 on page 59 and next ones of this specification.
Conditions for High Temperature Storage Test
The temperature to be applied must be the maximum
storage temperature specified in Table 11 on page 9 of this
specification.
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