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| 型号： | NOIH2SM1000S-HHC |
| 厂商： | ON Semiconductor |
| 文件页数： | 45/67页 |
| 文件大小： | 0K |
| 描述： | IC SPACE IMAGE SENSOR 84-JLCC |
| 标准包装： | 1 |
| 系列： | HAS2 |
| 象素大小： | 18µm x 18µm |
| 有源象素阵列： | 1024H x 1024V |
| 电源电压： | 3.3V |
| 类型： | CMOS 成像 |
| 封装/外壳： | * |
| 供应商设备封装： | * |
| 包装： | * |
| 其它名称： | CYIH1SM1000AA-HHCS CYIH1SM1000AA-HHCS-ND |
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NOIH2SM1000A
pixel
output
level
r: non ? correlated reset level
empty well
pixel output = (s ? r)
s: pixel signal level
full well
tEXP
time
Figure 31. Double Sampling: Pixel Signal is Read (s), then Pixel is Reset, then Reset Level is Read (r)
Correlated Double Sampling ? Nondestructive Readout
In correlated double sampling or nondestructive readout
(CDS/NDR) mode the YRST or YRD pointer quickly runs
over the frame, top to bottom, resetting each line it
addresses. This leaves the pixel array drained of charges, in
black or dark state.
Then the YRD or YRST pointer is run over the region of
interest of the frame, and of each line addressed the pixels’
black levels are read out and passed on to the ADC. The user
stores these black levels in an off-chip frame-sized memory.
pixel
Then the system is held idling during the exposure time.
After the exposure time has elapsed, the frame is scanned
once more with the YRD or YRST pointer, and each line
addressed is read out again. These signal levels are passed
on to the ADC and then to the end user. At the same time, the
user retrieves the corresponding black levels from the
memory and subtracts them from the signal levels. This is
correlated double sampling, eliminating static offsets as
well as kTC noise
output
level
empty well
full well
frame time
r: correlated reset level, store in
SRAM
s: pixel signal level, output (s ? r) difference
tEXP
time
Figure 32. Correlated Double Sampling: Pixel is Reset, Reset Level is Read and Stored (r),
Pixel is Exposed, Signal Level is Read (s), Difference is Output
Possible Exposure Times
The range of exposure times attainable by the HAS is
entirely dependent on the user control strategy, although two
obvious scenarios can be envisaged:
In destructive readout/double sampling, a typical case is
a minimal exposure time equal to the line readout time, and
a maximal exposure time equal to the frame time. With
1024 x 1024 pixels in a frame, 10 frames per second, this
amounts to 98 m s and 100 ms.
In Nondestructive readout/correlated double sampling it
is not even possible to pinpoint a typical case, as all depends
on the exact reset (R), reset-read (r) and signal-read (s)
scheme the user employs. In the specific case of 10 MHz
pixel rate rate operation, 10 windowed frames per second,
and 40 windows of 20 x 20, each receiving the same
exposure time, and the whole FPA reset (R) at the start of the
frame, the minimal exposure time is 7.3 ms, the maximal
exposure time 90.2 ms. Depending on window
configuration, shorter and longer times are possible, though.
http://onsemi.com
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