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| 型号： | ADUC834BSZ |
| 厂商： | Analog Devices Inc |
| 文件页数： | 29/80页 |
| 文件大小： | 0K |
| 描述： | IC ADC DUAL16/24BIT W/MCU 52MQFP |
| 产品培训模块： | Process Control |
| 标准包装： | 1 |
| 系列： | MicroConverter® ADuC8xx |
| 核心处理器： | 8052 |
| 芯体尺寸： | 8-位 |
| 速度： | 12.58MHz |
| 连通性： | EBI/EMI，I²C，SPI，UART/USART |
| 外围设备： | POR，PSM，PWM，温度传感器，WDT |
| 输入/输出数： | 34 |
| 程序存储器容量： | 62KB（62K x 8） |
| 程序存储器类型： | 闪存 |
| EEPROM 大小： | 4K x 8 |
| RAM 容量： | 2.25K x 8 |
| 电压 - 电源 (Vcc/Vdd)： | 2.7 V ~ 5.25 V |
| 数据转换器： | A/D 3x16b，4x24b; D/A 1x12b |
| 振荡器型： | 内部 |
| 工作温度： | -40°C ~ 125°C |
| 封装/外壳： | 52-QFP |
| 包装： | 托盘 |
| 产品目录页面： | 738 (CN2011-ZH PDF) |
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REV. A
ADuC834
–35–
Note that Figure 22 represents a transfer function in 0-to-VDD
mode only. In 0-to-VREF mode (with VREF < VDD), the lower
nonlinearity would be similar, but the upper portion of the
transfer function would follow the “ideal” line right to the end,
showing no signs of endpoint linearity errors.
VDD
VDD–50mV
VDD–100mV
100mV
50mV
0mV
000 Hex
FFF Hex
Figure 22. Endpoint Nonlinearities Due to Amplifier
Saturation
The endpoint nonlinearities conceptually illustrated in Figure 22
get worse as a function of output loading. Most of the ADuC834
data sheet specifications assume a 10 k
resistive load to
ground at the DAC output. As the output is forced to source or
sink more current, the nonlinear regions at the top or bottom
(respectively) of Figure 22 become larger. With larger current
demands, this can significantly limit output voltage swing.
Figures 23 and 24 illustrate this behavior. It should be noted
that the upper trace in each of these figures is only valid for an
output range selection of 0-to-AVDD. In 0-to-VREF mode, DAC
loading will not cause high-side voltage drops as long as the
reference voltage remains below the upper trace in the corre-
sponding figure. For example, if AVDD = 3 V and VREF = 2.5 V,
the high-side voltage will not be affected by loads less than 5 mA.
But somewhere around 7 mA, the upper curve in Figure 24
drops below 2.5 V (VREF) indicating that at these higher currents,
the output will not be capable of reaching VREF.
SOURCE/SINK CURRENT – mA
5
05
10
15
OUTPUT
VOLTAGE
–
V
4
3
2
1
0
DAC LOADED WITH 0000 HEX
DAC LOADED WITH 0FFF HEX
Figure 23. Source and Sink Current Capability
with VREF = AVDD = 5 V
SOURCE/SINK CURRENT – mA
4
05
10
15
OUTPUT
VOLTAGE
–
V
3
1
0
DAC LOADED WITH 0000 HEX
DAC LOADED WITH 0FFF HEX
Figure 24. Source and Sink Current Capability
with VREF = VDD = 3 V
For larger loads, the current drive capability may not be
sufficient. In order to increase the source and sink current
capability of the DAC, an external buffer should be added, as
shown in Figure 25.
ADuC834
12
Figure 25. Buffering the DAC Output
The DAC output buffer also features a high impedance disable
function. In the chip’s default power-on state, the DAC is
disabled and its output is in a high impedance state (or “three-
state”) where they remain inactive until enabled in software.
This means that if a zero output is desired during power-up or
power-down transient conditions, a pull-down resistor must be
added to each DAC output. Assuming this resistor is in place,
the DAC output will remain at ground potential whenever the
DAC is disabled.
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