参数资料
型号: B900M24FXX12IT
元件分类: 数字信号处理
英文描述: 0-BIT, 59.88 MHz, OTHER DSP, PQCC44
文件页数: 76/100页
文件大小: 1547K
代理商: B900M24FXX12IT
Advance Data Sheet
B900
July 1999
Baseband Signal Processor
Lucent Technologies Inc.
77
8 Timing Requirements and Characteristics
Requirements are restrictions on the external device connected to the B900. Characteristics are properties of the
The characteristics listed are valid under the following conditions:
s
VSS = 0 V, VDD = 5.0 V ± 0.5 V, TA = 0 °C to 70 °C, CLOAD = 50 pF, TMIN = 10.0 ns
s
VSS = 0 V, VDD = 3.3 V ± 0.3 V, TA = –40 °C to +85 °C, CLOAD = 50 pF, TMIN = 12.5 ns
Output characteristics can be derated as a function of load capacitance (CL):
s
For all rising edge outputs, dt/dCL
≤ 0.06 ns/pF for 0 ≤ CL ≤ 100 pF at 2.0 V
s
For all falling edge outputs, dt/dCL
≤ 0.05 ns/pF for 0 ≤ CL ≤ 100 pF at 0.8 V
For example, the derating for a time delay that includes a rising edge with an external load of 20 pF is as follows:
t = (CL – CLOAD) dt/dCL = (20 – 50) 0.06 = –1.8 ns
Output characteristics assume standard slew rate buffers. See Table 44 on page 55 for information on mask
options, for slow buffers option all the output times should be increased by the additional time given by the
equation:
t = 0.4
CL
Where CL is the load capacitance in picofarads, and t is the additional output delay in nanoseconds. For example,
for load capacitance of 50 pF, with slow buffers option, all output timing characteristics should be increased by
20 ns.
For definitions of the VIH, VIL, VOH, and VOL labels, see Table 91 on page 72. In this section’s timing diagrams,
these labels distinguish inputs and outputs.
8.1
Input Clock Options
The input clocks to the B900 allow for the use of either CMOS level input signals or an internal crystal oscillator
with an external crystal. This allows the user to select either both clock inputs to use the internal crystal oscillator
or XTALA may be driven with a CMOS level signal. In the latter case, the OSCBYP pin should be pulled high
externally, while XTALB is terminated by a 20 pF capacitor.
Table 98. Test Conditions
Test Conditions for Inputs
Test Conditions for Outputs
Rise and fall times of 4 ns or less.
CLOAD = 50 pF.
Timing reference levels for delays = VIH, VIL.
Timing reference levels for delays = VOH, VOL.
3-state delays are measured to the high-impedance
state of the output driver.
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