参数资料
型号: MCR705JP7CDWE
厂商: Freescale Semiconductor
文件页数: 156/164页
文件大小: 0K
描述: MCU 8BIT 224B RAM 28-SOIC
标准包装: 26
系列: HC05
核心处理器: HC05
芯体尺寸: 8-位
速度: 2.1MHz
连通性: SIO
外围设备: POR,温度传感器,WDT
输入/输出数: 22
程序存储器容量: 6KB(6K x 8)
程序存储器类型: OTP
RAM 容量: 224 x 8
电压 - 电源 (Vcc/Vdd): 2.7 V ~ 5.5 V
数据转换器: A/D 4x12b
振荡器型: 内部
工作温度: -40°C ~ 85°C
封装/外壳: 28-SOIC(0.295",7.50mm 宽)
包装: 管件
Voltage Measurement Methods
MC68HC705JJ7 MC68HC705JP7 Advance Information Data Sheet, Rev. 4.1
Freescale Semiconductor
91
8.6.2 Ratiometric Voltage Readings
The ratiometric value of a voltage measurement can be calculated in software by first taking a reference
reading from a reference source and then comparing subsequent unknown voltages to that reading as a
percentage of the reference value. The accuracy of ratiometric readings will depend on the variety of
sources, but will generally be better than for absolute readings. Many of these error sources can be
taken into account using the features of the analog subsystem and appropriate software as described in
Table 8-7. As with absolute measurements, most of the errors can be reduced by frequent comparisons
to the reference voltage, use of the inverted comparator inputs, and averaging of multiple samples.
8.6.2.1 Internal Ratiometric Reference
If readings are to be ratiometric to VDD, the reference measurement point can be internally selected. In
this case the reference reading can be taken by setting the VREF bit and clearing the MUX1:4 bits in the
AMUX register which connects the channel selection bus to the VDD pin. In order to stay within the VMAX
range, the DHOLD bit should be used to select the 1/2 divided input.
8.6.2.2 External Ratiometric Reference
If readings are to be ratiometric to some external source, the reference measurement point can be
connected to any one of the channel selected pins from PB1–PB4. In this case, the reference reading can
be taken by setting the MUX bit in the AMUX which connects channel selection bus to the pin connected
to the external reference source. If the external reference is greater than VDD –1.5 volts, then the DHOLD
bit should be used to select the 1/2 divided input.
Table 8-7. Ratiometric Voltage Reading Errors
Error Source
Accuracy Improvements Possible
In Hardware
In Software
Change in reference voltage
Not required for ratiometric
Compare unknown with recent measurement
from reference
Change in magnitude of ramp
current source
Not adjustable
Compare unknown with recent measurement
from reference
Non-linearity of ramp current
source vs. voltage
Not adjustable
Calibration and storage of voltages at 1/4,
1/2, 3/4, and FS
Frequency shift in internal
low-power oscillator
Not required for ratiometric
Compare unknown with recent measurement
from reference
Sampling capacitor leakage
Use faster conversion times
Compare unknown with recent measurement
from reference
Internal voltage divider ratio
Not adjustable
Compare unknown with recent measurement
from reference
Input offset voltage of
comparator 2
Not adjustable
Sum two readings on reference or unknown
using INV and INV control bit and divide by 2
(average of both)
Noise internal to MCU
Close decoupling at VDD and VSS pins and
reduce supply source impedance
Average multiple readings on both the
reference and the unknown voltage
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