参数资料
型号: MCR705JP7CDWE
厂商: Freescale Semiconductor
文件页数: 159/164页
文件大小: 0K
描述: MCU 8BIT 224B RAM 28-SOIC
标准包装: 26
系列: HC05
核心处理器: HC05
芯体尺寸: 8-位
速度: 2.1MHz
连通性: SIO
外围设备: POR,温度传感器,WDT
输入/输出数: 22
程序存储器容量: 6KB(6K x 8)
程序存储器类型: OTP
RAM 容量: 224 x 8
电压 - 电源 (Vcc/Vdd): 2.7 V ~ 5.5 V
数据转换器: A/D 4x12b
振荡器型: 内部
工作温度: -40°C ~ 85°C
封装/外壳: 28-SOIC(0.295",7.50mm 宽)
包装: 管件
Analog Subsystem
MC68HC705JJ7 MC68HC705JP7 Advance Information Data Sheet, Rev. 4.1
94
Freescale Semiconductor
8.11 Port B Interaction with Analog Inputs
The analog subsystem is connected directly to the port B I/O pins without any intervening gates. It is,
therefore, possible to measure the voltages on port B pins set as inputs or to have the analog voltage
measurements corrupted by port B pins set as outputs.
8.12 Port B Pins as Inputs
All the port B pins will power up as inputs or return to inputs after a reset of the device since the bits in the
port B data direction register will be reset.
If any port B pins are to be used for analog voltage measurements, they should be left as inputs. In this
case, not only can the voltage on the pin be measured, but the logic state of the port B pins can be read
from location $0002.
8.13 Port B Pulldowns
All the port B pins have internal software programmable pulldown devices available dependent on the
state of the SWPDI bit in the mask option register (MOR).
If the pulldowns are enabled, they will create an approximate 100
A load to any analog source connected
to the pin. In some cases, the analog source may be able to supply this current without causing any error
due to the analog source output impedance. Since this may not always be true, it is therefore best to
disable port B pulldowns on those pins used for analog input sources.
8.14 Noise Sensitivity
In addition to the normal effects of electrical noise on the analog input signal there can also be other
noise-related effects caused by the digital-to-analog interface. Since there is only one VSS return for both
the digital and the analog subsystems on the device, currents in the digital section may affect the analog
ground reference within the device. This can add voltage offsets to measured inputs or cause
channel-to-channel crosstalk.
To reduce the impact of these effects, there should be no switching of heavy I/O currents to or from the
device while there is a critical analog conversion or voltage comparison in process. Limiting switched I/O
currents to 2–4 mA during these times is recommended.
A noise reduction benefit can be gained with 0.1-
F bypass capacitors from each analog input (PB4:1) to
the VSS pin. Also, try to keep all the digital power supply or load currents from passing through any
conductors which are the return paths for an analog signal.
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