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参数资料
| 型号： | IBM21P100BGB |
| 元件分类： | 总线控制器 |
| 英文描述： | PCI BUS CONTROLLER, PBGA304 |
| 封装： | 31 X 31 MM, HEAT SINK, PLASTIC, BGA-304 |
| 文件页数： | 26/140页 |
| 文件大小： | 2032K |
| 代理商： | IBM21P100BGB |
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IBM21P100BGB
IBM 133 PCI-X Bridge R1.1
ppb11_jtag.fm.03
July 9, 2001
JTAG Boundary Scan
Page 113 of 131
9.5.1 Boundary-Scan Register Bit Map
Table 19 gives the mapping between the bit position in the Boundary-Scan register and the signal or control
function that it represents. The index is ordered from JTG_TDO to JTG_TDI. The value on JTG_TDI is
applied on the rising edge of JTG_TCK, and JTG_TDO is valid on the falling edge of JTG_TCK. The
JTG_TDO driver is enabled by the TAP Controller; all other tristate drivers are controlled by the Boundary-
Scan register control cells listed in the table (and also by the HIGHZ instruction code).
Output-only pins:
For device outputs that are not shared with component test functions, the
boundary-scan cell “IBM1149_BSR_BIDIOUT” is used. Outputs that are shared
with component test inputs use the “IBM1149_BSR_OUT” boundary-scan cell,
while those that are shared with component test outputs use the
“IBM1149_BSR_TESTOUT” boundary-scan cell. The BSDL function label of
“OUTPUT2” is used for two-state outputs; “OUTPUT3” is used for three-state
outputs.
Bidirectional pins:
For bidirectional device pins that are not shared with component test outputs, the
boundary-scan cell “IBM1149_BSR_BIDI” is used. Bidirectional pins that are
shared with component test inputs use the “IBM1149_BSR_BIDI_SIO” boundary-
scan cell, while those that are shared with component test outputs use the
“IBM1149_BSR_BIDITESTOUT” boundary-scan cell. All have the BSDL function
label of “BIDIR”.
Control Functions:
Two different boundary-scan cells are used to control the device’s driver enables:
“IBM1149_BSR_ENAB” and “IBM1149_BSR_FASTENAB”. While they perform the
same boundary-scan function, they differ in that the “IBM1149_BSR_FASTENAB”
cell has a faster functional path through it; hence it is often used on timing-critical
signals. Both have the BSDL function label of “CONTROL”.
Table 19: Boundary-Scan Register Bit Map (Page 1 of 12)
Bit Position
Cell Type
Port Name
Function
Tristate
Control Cell
0
IBM1149_BSR_BIDI
P_STOP_N
BIDIR
286
1
IBM1149_BSR_BIDI
P_AD(49)
BIDIR
254
2
IBM1149_BSR_BIDI
P_AD(50)
BIDIR
255
3
IBM1149_BSR_BIDI
P_AD(51)
BIDIR
256
4
IBM1149_BSR_BIDI_SIO
RESERVED7
BIDIR
373
5
IBM1149_BSR_BIDI
P_AD(52)
BIDIR
257
6
IBM1149_BSR_BIDI
P_AD(53)
BIDIR
258
7
IBM1149_BSR_BIDI
P_AD(54)
BIDIR
259
8
IBM1149_BSR_BIDI
P_AD(55)
BIDIR
260
9
IBM1149_BSR_BIDITESTOUT
P_ACK64_N
BIDIR
204
10
IBM1149_BSR_BIDI
P_PERR_N
BIDIR
282
11
IBM1149_BSR_OUT
P_SERR_N
OUTPUT3
285
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