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参数资料
| 型号： | ADE7569ASTZF16 |
| 厂商： | Analog Devices Inc |
| 文件页数： | 67/136页 |
| 文件大小： | 0K |
| 描述： | IC ENERGY METER MCU 16K 64LQFP |
| 标准包装： | 1 |
| 输入阻抗： | * |
| 测量误差： | * |
| 电压 - 高输入/输出： | * |
| 电压 - 低输入/输出： | * |
| 电流 - 电源： | * |
| 电源电压： | * |
| 测量仪表类型： | * |
| 工作温度： | * |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 64-LQFP |
| 供应商设备封装： | 64-LQFP（10x10） |
| 包装： | 托盘 |
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Preliminary Technical Data
TEMPERATURE MEASUREMENT
ADE7566/ADE7569
Start ADC Measurement SFR (ADCGO, 0xD8).
To provide a digital temperature measurement, each
ADE7566/ADE7569 includes a dedicated ADC. An 8-bit
Temperature ADC Value SFR (TEMPADC, 0xD7) holds the
results of the temperature conversion. The resolution of the
?
Background temperature measurements are not available.
In PSM2 operating mode, the 8052 is not active.
Temperature conversions are available through the
background measurement mode only.
temperature measurement is 0.78°C/LSB. There are two ways to
initiate a temperature conversion: a single temperature
measurement or background temperature measurements.
Single Temperature Measurement
Set the TEMP_ADC_GO bit in the Start ADC Measurement
SFR (ADCGO, 0xD8) to obtain a temperature measurement.
The Temperature ADC Value SFR (TEMPADC, 0xD7) is
updated with a new value only when a temperature ADC
interrupt occurs.
Temperature ADC Interrupt
The temperature ADC can generate an ADC interrupt when at
least one of the following conditions occurs:
An interrupt is generated when the conversion is complete and
when the temperature measurement is available in the
Temperature ADC Value SFR (TEMPADC, 0xD7).
Background Temperature Measurements
?
?
The difference between the new temperature ADC value and
the last temperature ADC value generating an ADC interrupt
is larger than the value set in the TEMP_DIFF[2:0] bits.
The temperature ADC conversion, initiated by setting Start
Background temperature measurements are disabled by default.
To configure the background temperature measurement mode,
set a temperature measurement interval in the Peripheral ADC
Strobe Period SFR (STRBPER, 0xF9). Temperature
measurements are then performed periodically in the background
(see Table 45).
When a temperature conversion completes, the new temperature
ADC value is compared to the last temperature ADC value that
created an interrupt. If the absolute difference between the two
values is greater than the setting in the TEMP_DIFF[2:0] bits in
the Temperature and Supply Delta SFR (DIFFPROG, 0xF3), a
TEMPADC interrupt is generated. This allows temperature
measurements to take place completely in the background, only
requiring MCU activity if the temperature has changed more
than a configurable delta.
To set up background temperature measurements, follow these
steps:
ADC Measurement SFR (ADCGO, 0xD8) finishes.
When the ADC interrupt occurs, a new value is available in the
Temperature ADC Value SFR (TEMPADC, 0xD7). Note that
there is no flag associated with this interrupt.
BATTERY MEASUREMENT
To provide a digital battery measurement, each
ADE7566/ADE7569 includes a dedicated ADC. The battery
measurement is available in an 8-bit SFR (Battery ADC Value
SFR (BATADC, 0xDF)). The battery measurement has a
resolution of 15 mV/LSB. A battery conversion can be initiated
by two methods: a single battery measurement or background
battery measurements.
Single Battery Measurement
Set the BATT_ADC_GO bit in the Start ADC Measurement
SFR (ADCGO, 0xD8) to obtain a battery measurement. An
interrupt is generated when the conversion is done and when
1.
2.
3.
Initiate a single temperature measurement by setting the
TEMP_ADC_GO bit in the Start ADC Measurement SFR
(ADCGO, 0xD8).
Upon completion of this measurement, configure the
TEMP_DIFF[2:0] bits to establish the change in temperature
that triggers an interrupt.
Set up the interval for background temperature measurements
by configuring the TEMP_PERIOD[1:0] bits in the
the battery measurement is available in the Battery ADC Value
SFR (BATADC, 0xDF).
Background Battery Measurements
To configure background measurements for the battery,
establish a measurement interval in the Peripheral ADC Strobe
Period SFR (STRBPER, 0xF9). Battery measurements are then
performed periodically in the background (see Table 45).
Peripheral ADC Strobe Period SFR (STRBPER, 0xF9).
Temperature ADC in PSM0, PSM1, and PSM2
Depending on the operating mode of the ADE7566/ADE7569,
a temperature conversion is initiated only by certain actions.
When a battery conversion completes, the battery ADC value is
compared to the low battery threshold, established in the
Battery Detection Threshold SFR (BATVTH, 0xFA). If the
battery ADC value is below this threshold, a low battery flag is
set. This low battery flag is the FBAT bit in the Power
?
?
In PSM0 operating mode, the 8052 is active. Temperature
measurements are available in the background measurement
mode and by initiating a single measurement.
In PSM1 operating mode, the 8052 is active and the part
is battery powered. Single temperature measurements
can be initiated by setting the TEMP_ADC_GO bit in the
Management Interrupt Flag SFR (IPSMF, 0xF8), which is used
for power supply monitoring. This low battery flag can be
enabled to generate the PSM interrupt by setting the EBAT bit
in the Power Management Interrupt Enable SFR (IPSME,
0xEC). This method allows battery measurements to take place
completely in the background, only requiring MCU activity if
the battery drops below a user-specified threshold.
Rev. PrA | Page 67 of 136
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相关代理商/技术参数 |
参数描述 |
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| ADE7569ASTZF162 | 制造商:AD 制造商全称:Analog Devices 功能描述:Single-Phase Energy Measurement IC with 8052 MCU, RTC, and LCD Driver |
| ADE7569ASTZF16-RL | 功能描述:IC ENERGY METER 1PHASE 64-LQFP RoHS:是 类别:集成电路 (IC) >> PMIC - 能量测量 系列:- 产品培训模块:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 标准包装:2,500 系列:* |
| ADE7569ASTZF16-RL2 | 制造商:AD 制造商全称:Analog Devices 功能描述:Single-Phase Energy Measurement IC with 8052 MCU, RTC, and LCD Driver |
| ADE7751 | 制造商:AD 制造商全称:Analog Devices 功能描述:Energy Metering IC with On-Chip Fault Detection |
| ADE7751AAN-REF | 制造商:AD 制造商全称:Analog Devices 功能描述:Energy Metering IC with On-Chip Fault Detection |
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