参数资料
型号: MT42L64M32D1KL-3 IT:A
厂商: Micron Technology Inc
文件页数: 156/164页
文件大小: 0K
描述: IC DDR2 SDRAM 2GBIT 168FBGA
标准包装: 1,000
格式 - 存储器: RAM
存储器类型: 移动 LPDDR2 SDRAM
存储容量: 2G(64M x 32)
速度: 333MHz
接口: 并联
电源电压: 1.14 V ~ 1.3 V
工作温度: -25°C ~ 85°C
封装/外壳: 168-WFBGA
供应商设备封装: 168-FBGA(12x12)
包装: 散装
2Gb: x16, x32 Mobile LPDDR2 SDRAM S4
Data Setup, Hold, and Slew Rate Derating
Data Setup, Hold, and Slew Rate Derating
For all input signals (DQ, DM) calculate the total required setup time ( t DS) and hold
time ( t DH) by adding the data sheet t DS(base) and t DH(base) values (see Table 92
(page 156)) to the Δ t DS and Δ t DH derating values, respectively (see Table 94 and Ta-
ble 95 (page 157)). Example: t DS = t DS(base) + Δ t DS.
The typical t DS slew rate for a rising signal is defined as the slew rate between the last
crossing of V REF(DC) and the first crossing of V IH(AC)min . The typical t DS slew rate for a
falling signal is defined as the slew rate between the last crossing of V REF(DC) and the
first crossing of V IL(AC)max (see Figure 101 (page 159)).
If the actual signal is consistently earlier than the typical slew rate line in Figure 97
(page 152) the area shaded gray between the V REF(DC) region and the AC region, use the
typical slew rate for the derating value. If the actual signal is later than the typical slew
rate line anywhere between the shaded V REF(DC) region and the AC region, the slew rate
of a tangent line to the actual signal from the AC level to the DC level is used for the
derating value (see Figure 99 (page 154)).
The typical t DH slew rate for a rising signal is defined as the slew rate between the last
crossing of V IL(DC)max and the first crossing of V REF(DC) . The typical t DH slew rate for a
falling signal is defined as the slew rate between the last crossing of V IH(DC)min and the
first crossing of V REF(DC) (see Figure 102 (page 160)).
If the actual signal is consistently later than the typical slew rate line between the
shaded DC-level-to-V REF(DC) region, use the typical slew rate for the derating value. If
the actual signal is earlier than the typical slew rate line anywhere between shaded DC-
to-V REF(DC) region, the slew rate of a tangent line to the actual signal from the DC level
to the V REF(DC) level is used for the derating value (see Figure 104 (page 162)).
For a valid transition, the input signal must remain above or below V IH /V IL(AC) for the
specified time, t VAC (see Table 96 (page 158)).
The total setup time for slow slew rates could be negative (that is, a valid input signal
may not have reached V IH /V IL(AC) at the time of the rising clock transition). A valid input
signal is still required to complete the transition and reach V IH /V IL(AC) .
For slew rates between the values listed in Table 92 and Table 93, the derating values
can be obtained using linear interpolation. Slew rate values are not typically subject to
production testing. They are verified by design and characterization.
Table 92: Data Setup and Hold Base Values (>400 MHz, 1 V/ns Slew Rate)
Data Rate
Parameter
1066
933
800
667
533
466
Reference
t DS
t DH
(base)
(base)
-10
80
15
105
50
140
130
220
210
300
230
320
V IH /V IL(AC) = V REF(DC) ±220mV
V IH /V IL(DC) = V REF(DC) ±130mV
Note:
1. AC/DC referenced for 1 V/ns DQ, DM slew rate, and 2 V/ns differential DQS/DQS# slew
rate.
PDF: 09005aef83f3f2eb
2gb_mobile_lpddr2_s4_g69a.pdf – Rev. N 3/12 EN
156
Micron Technology, Inc. reserves the right to change products or specifications without notice.
2010 Micron Technology, Inc. All rights reserved.
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