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参数资料
| 型号： | ADUC7061BCPZ32-RL |
| 厂商： | Analog Devices Inc |
| 文件页数： | 22/108页 |
| 文件大小： | 0K |
| 描述： | IC MCU 16/32BIT 32KB 32LFCSP |
| 产品变化通告： | ADuC7060/1 Idd Specification Change 01/Feb/2010 |
| 设计资源： | USB Based Temperature Monitor Using ADuC7061 and an External RTD (CN0075) 4 mA-to-20 mA Loop-Powered Temperature Monitor Using ADuC7060/1 (CN0145) |
| 标准包装： | 5,000 |
| 系列： | MicroConverter® ADuC7xxx |
| 核心处理器： | ARM7 |
| 芯体尺寸： | 16/32-位 |
| 速度： | 10MHz |
| 连通性： | I²C，SPI，UART/USART |
| 外围设备： | POR，PWM，温度传感器，WDT |
| 输入/输出数： | 8 |
| 程序存储器容量： | 32KB（16K x 16） |
| 程序存储器类型： | 闪存 |
| RAM 容量： | 1K x 32 |
| 电压 - 电源 (Vcc/Vdd)： | 2.375 V ~ 2.625 V |
| 数据转换器： | A/D 5x24b，8x24b，D/A 1x14b |
| 振荡器型： | 内部 |
| 工作温度： | -40°C ~ 125°C |
| 封装/外壳： | 32-VFQFN 裸露焊盘，CSP |
| 包装： | 带卷 (TR) |
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ADuC7060/ADuC7061
Data Sheet
Rev. D | Page 20 of 108
TERMINOLOGY
Conversion Rate
The conversion rate specifies the rate at which an output result
is available from the ADC, when the ADC has settled.
The sigma-delta (Σ-Δ) conversion techniques used on this part
mean that whereas the ADC front-end signal is oversampled at
a relatively high sample rate, a subsequent digital filter is used to
decimate the output, giving a valid 24-bit data conversion result
at output rates from 1 Hz to 8 kHz.
Note that, when software switches from one input to another
(on the same ADC), the digital filter must first be cleared and
then allowed to average a new result. Depending on the con-
figuration of the ADC and the type of filter, this can take
multiple conversion cycles.
Integral Nonlinearity (INL)
INL is the maximum deviation of any code from a straight line
passing through the endpoints of the transfer function. The end-
points of the transfer function are zero scale, a point LSB
below the first code transition, and full scale, a point LSB
above the last code transition (111 . . . 110 to 111 . . . 111).
The error is expressed as a percentage of full scale.
No Missing Codes
No missing codes is a measure of the differential nonlinearity
of the ADC. The error is expressed in bits and specifies the
number of codes (ADC results) as 2N bits, where N is no
missing codes guaranteed to occur through the full ADC
input range.
Offset Error
Offset error is the deviation of the first code transition ADC
input voltage from the ideal first code transition.
Offset Error Drift
Offset error drift is the variation in absolute offset error with
respect to temperature. This error is expressed as least
significant bits per degree Celsius.
Gain Error
Gain error is a measure of the span error of the ADC. It is a
measure of the difference between the measured and the ideal
span between any two points in the transfer function.
Output Noise
The output noise is specified as the standard deviation (or 1 ×
Sigma) of the distribution of the ADC output codes collected
when the ADC input voltage is at a dc voltage. It is expressed as
micro root mean square. The output, or root mean square (rms)
noise, can be used to calculate the effective resolution of the
ADC as defined by the following equation:
Effective Resolution = log2(Full-Scale Range/rms Noise) bits
The peak-to-peak noise is defined as the deviation of codes that
fall within 6.6 × Sigma of the distribution of ADC output codes
collected when the ADC input voltage is at dc. The peak-to-peak
noise is, therefore, calculated as
6.6 × rms Noise
The peak-to-peak noise can be used to calculate the ADC
(noise free code) resolution for which there is no code flicker
within a 6.6-Sigma limit as defined by the following equation:
Noise Free Code Resolution = log2
Noise
Peak
to
Peak
Range
Scale
Full
bits
Data Sheet Acronyms
ADC analog-to-digital converter
ARM advanced RISC machine
JTAG joint test action group
LSB least significant byte/bit
LVF low voltage flag
MCU microcontroller
MMR memory mapped register
MSB most significant byte/bit
PID protected identifier
POR power-on reset
PSM power supply monitor
rms
root mean square
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